IEEE32-1972(1990修订版)IEEE-Standard-Requirements--Te

ANSI/IEEEStd32-1972(Reaffirmed1990)AnAmericanNationalStandardIEEEStandardRequirements,Terminology,andTestProcedureforNeutralGroundingDevicesSponsorSurgeProtectiveDevicesCommitteeoftheIEEEPowerEngineeringSocietyApprovedMarch21,1972ReaffirmedJune16,1978ReaffirmedSeptember13,1984ReaffirmedSeptember28,1990IEEEStandardsBoardApprovedMarch29,1985ReaffirmedFebruary27,1991AmericanNationalStandardsInstituteAbstract:IEEEStd32-1972(Reaff1990);IEEEStandardRequirements,Terminology,andTestProceduresforNeutralGroundingDevices.Thisstandardappliestodevices(otherthansurgearresters)usedforthepurposeofcontrollingthegroundcurrentorthepotentialstogroundofalternatingcurrentsystems.Itdefinesusualandunusualserviceconditions,andgivesbasesforratingsuchdevices.Specificationsaregivenfortemperaturelimitations,dielectrictests,routinetests,lossesandimpedancemeasurements,andconstructionitems.©Copyright1972byTheInstituteofElectricalandElectronicsEngineers,Inc345East47thStreet,NewYork,NY10017,USANopartofthispublicationmaybereproducedinanyform,inanelectronicretrievalsystemorotherwise,withoutpriorwrittenpermissionofthepublisher.CopyrightTheInstituteofElectricalandElectronicsEngineers,Inc.ProvidedbyIHSunderlicensewithIEEENotforResaleNoreproductionornetworkingpermittedwithoutlicensefromIHS--``,-`-`,,`,,`,`,,`---ForewordThisstandardisarevisionofAIEEStandard32,1947,towhichmanychangesandadditionshavebeenmade.ThisstandardwasdevelopedbytheNeutralGroundingSubcommitteeoftheSurgeProtectiveDevicesCommitteeoftheIEEEPowerEngineeringSociety.ThemembershipoftheSub-committeeisasfollows:N.Stadtfeld,Jr,ChairG.G.AuerL.B.CrannG.S.HaralampuP.F.HargreavesD.W.JacksonI.B.JohnsonJ.L.KoepfingerF.R.LiciniJ.A.McKinleyD.E.OrtenW.J.VandergriftG.G.AuerwasChairmanoftheSubcommitteeduringthebulkoftheperiodofpreparationofthisissue.Otherswhotookpartareasfollows:E.W.BoehneG.D.BreuerL.V.DevineJ.B.HaysC.C.JonesJ.C.RussL.E.SauerWhentheSurgeProtectiveDevicesCommitteeoftheIEEEPowerEngineeringSocietyreviewedandapprovedthisdocument,ithadthefollowingmembership:A.G.Yost,ChairI.B.Johnson,ViceChairW.R.Ossman,SecretaryD.L.AndrewsS.A.AnnestrandJ.J.ArchambaultG.G.AuerR.D.BallG.A.BarilF.G.BergE.W.BochneP.W.BognerG.D.BreuerL.B.CrannW.H.EasonH.E.FoelkerG.L.GaibroisR.S.GensG.S.HaralampuA.R.HilemanD.W.JacksonS.S.Kershaw,JrJ.L.KoepfingerF.R.LiciniH.LinckD.J.MelvoldB.D.MillerV.B.NolanJ.D.M.PhelpsR.W.PowellW.S.PriceR.E.SeabrookJ.W.SimpsonN.Stadtfeld,JrM.W.StoddartH.L.ThwaitesA.C.WestromCopyrightTheInstituteofElectricalandElectronicsEngineers,Inc.ProvidedbyIHSunderlicensewithIEEENotforResaleNoreproductionornetworkingpermittedwithoutlicensefromIHS--``,-`-`,,`,,`,`,,`---iiiCLAUSEPAGE1.General................................................................................................................................................................11.1Scope..........................................................................................................................................................11.2ServiceConditions.....................................................................................................................................11.3OperationatAltitudesinExcessof3300ft(1000m)...............................................................................22.BasisforRating...................................................................................................................................................32.1Conditions..................................................................................................................................................32.2RatedCurrent.............................................................................................................................................32.3RatedVoltage............................................................................................................................................42.4RatedFrequency.......................................................................................................................................52.5RatedTime.................................................................................................................................................53.InsulationClassesandDielectricWithstandLevels...........................................................................................53.1BasicImpulseInsulationLevelsandInsulationClasses..........................................................................53.2DielectricWithstandTestLevels...............................................................................................................73.3ProtectiveDevices......................................................................................................................................74.TemperatureLimitations.....................................................................................................................................74.1Limits.............................................................................