光谱发射率测量技术-戴景民

：2008-10-11；：2008-12-15：(1963)，，，，、、。Emai:[e-mail]38420098Vol.38No.4InfraredandLaserEngineeringAug.2009，，(，150001)：、、、。，，。，4：、、。、、。，。，。：；；；；：TB92：A：1007-2276(2009)04-0710-06ReviewofspectralemissivitymeasurementDAIJing蛳min,SONGYang,WANGZong蛳wei(SchoolofElectricalEngineeringandAutomation,HarbinInstituteofTechnology,Harbin150001,China)Abstract:Thepracticalapplicationandvitalsignificanceofspectralemissivityinastronautics,aeronautics,nationaldefenseandmilitaryhavebeendiscussed.Sincetherearemanyinfluencefactorsonspectralemissivityanditsapplication,alotofemissivitymeasurementapparatusindifferenttypeshavebeensetupinmanycountries.Accordingtothemeasurementcharacteristicandapplicationscope,theemissivitymeasurementmethodswereclassifiedasfourkinds,calorimetric,reflection,energyandmulti蛳wavelengthmethod.Thebasicschematic,apparatuscharacteristic,techniqueindexanddevelopmentstatuswereintroducedforeverymethod.TheemissivitymeasurementapparatusbasedoninfraredFourieranalysisspectrometerwereintroduced.Thespecificapplicationsinthevitalfieldsweredescribed.Andtheproblemsexistedinourcountryfortheemissivitymeasurementhavebeenanalyzed.Finally,thetendencyandfutureworkondatabaseoftheemissivitymeasurementwereforecasted.Keywords:Metrology;Emissivitymeasurement;Review;Radiation;Temperature0(、)，。。，，、4、、。、、、、、。，、、，。，、，。，。，。1，，()，、[1]。，、、，1。1Fig.1Classificationchartofemissivitymeasurementmethods1.1[2-5]。：，，，，。。1.1.1Worthing1941———。Richmond(1960)、Howl(1962)Cezairliyan(1970)。，。、，2％。，-50~1000℃。，，，，；、、。1.1.2(、)，，、，。2060Ramanathan、、、。，。2070，NIST(NBS)Cezairliyan，8。，Righini，NIST30，。2090，NISTCezairliyan(DOAP),。，NMIJ（NRLM）Matsumoto、Graz、，CRIDOAP，。2000，。：，，(4000℃)，，；。1.2，，：71138，，。、(、)、。1.2.11962Dunkle[6]，1~15μm，35μm。，，，。，，，，。3%~5%。1.2.2。：，，，。，。，。，IMGCRighini。2000。，5000℃，1.2.32090，NISTNordince，2。Cezairliyan2Fig.2Laserpolarizationemissivityapparatus，5%，0.3s，。1.3，－[7]。，，，。2060，，、、，。，2~28μm，3000℃。1984，2.5~25μm;400~1000℃;3%~5%，()。2090，，。3NMIJ[8]。Michelson，5~12μm，HgCdTe；-20~100℃；。1992，Lindermeir（500K）[9]，4。1.3~5.4μm，0.5cm-1。1994Markham[10]3NMIJFig.3MeasurementapparatusofemissivitydesignedbyNMIJofJapan71244LindermeirFig.4MeasurementapparatusdesignedbyLindermeir,etc5。，50～2000℃，±5％，0.8～20μm，±3％。10～40mm，1～3mm。5Fig.5Measurementsystemofthesemi蛳ellipsoidalmirrorreflector，1998，Bauer[11]，6。6BauerFig.6MeasurementequipmentdesignedbyBauer,etc0.4~25μm，100~1500℃，1min，0.2μm。0.8~25μm，100~1200℃，5.8%。，B.zhang[12]，7。0.6~9.6μm，400～1000K，0~300K。7B.ZhangFig.7MeasurementequipmentdesignedbyB.zhang,etcModest[13]，1～20μm，1550℃，8。8ModestFig.8MeasurementapparatusdesignedbyModest：71338NIST[14]，9。，1～20μm，600～1400K，。9NISTFig.9MeasurementsystemofNISTinfraredspectrumemissivity2004[15]，10。MCTSi，0.6μm25μm。，60~1500℃。：(500~1500℃)(60~500℃)，。，2400℃。10Fig.10Measurementapparatusdesignedbyauthor，，，，，11、12。11Fig.11Schematicdiagramofthewholeblackbody12Fig.12Schematicdiagramoftheconversionblackbody1.4[16]2070、80，、，。：，，，。，，，，。，。、，。：(1)~5000℃；(2)4~35；(3)0.5~1.1μm、1~3μm；8~14μm；(4)5%。、，。71442。(1)：、、，。(2)：、、、，。(3)：、、，、。(4)：、、，。3。，4：(1)，；(2)()，，；(3)()；(4)。，、、，，10~20。(1)。：1)0.2~25μm；2)-50~3200℃；3)1%~3%；4)。(2)，：1)0.2~1.1μm，1~3μm，3~5μm，7~14μm；2)50~5000℃；3)5%；4)。(3)，。：[1]CHUZai蛳xiang,SUNYu蛳xing,CHENShou蛳ren.Materialspectraemissivitymeasurementtechnique[J].InfraredResearch,1986,5A:231-239.(inChinese)[2]CEZAIRLIYANA,MCCLUREJ,LAYLORR.Thermophysicalmeasurementson90Ti蛳6Al蛳4Valloyabove1450Kusingatransinenttechnique[J].JournalofResearchoftheNationalBureauofStandards,SectionA,PhysicsandChemistry,1977,81(3):251-256.[3]RIGHINIF,ROBERTSRB,ROSSOA.Measutrmentofthermophysicalpropertiesbyapulse蛳heatingmethod:niobiumintherange1000~2500K[J].InternationalJournalofTherm蛳ophysics,1985,6(6):681-693.[4]KASCHNITZE,POTTLACHERG,JAEGERH.Newmicrosecondpulse蛳heatingsystemtoinvestigatethermophysicalpropertiesofsolidandliquidmetals[J].InternationalJournalofThermophysics,1992,13(4):699.[5]DAIJM,FANY,CHUZX.DevelopmentofaMillisecondPulse蛳HeatingApparatus[J].InternationalJournalofTherm蛳ophysics,2002,23(5):1401-1405.[6]DUNKLERV.InProgressinInternationalResearchonThermodynamicsandTransportPropertiesAsme[M].1962：100-106.[7]LIUBaoming,CHUZaixiang.Effectofdeviationofcavitytemperatureandwallemissivityonaccuracyofmaterialemissivitymeasurement[C]//10thEuropeanconferenceonThermophy蛳sicalProperties,1986:22-26.[8]ISHIIJ,ONOA.UncertaintyestimationforemissivitymeasurementsnearroomtemperaturewithaFouriertransformsspectrometer[J].MeasSciTechnol,2001,12:2103-2112.[9]LINDERMEIRE,TANKV,HASCHBERGERP.ContactlessMeasurementofthespectralemissivityandtempe蛳ratureofsurfaceswithafouriertransforminfraredspectrometer[C]//ProceedingsofSPIE,ThermosenseXIV:AnIntlConfonThermalSensingandImagingDiagnosticApplications,1992,1682:354-364[10]MARKHAMJR,KINSELLAK,CARANGELORM,etal.AbenchtopFT蛳IRbasedinstrumentforsimultaneouslymeasuringsurfacespectralemittanceandtemperature[J].RevSciInstrum,1993,64(9):2515-2522.[11]BAUERW,MOLDENHAUERA,OERTELH.Thermalradiationpropertiesofdifferentmetals[C]//ProceedingsofSPIE,ThermosenseXXVIII,2006,6205:1-12.[12]ZHANGB,REDGROVEJ,CLARKJ.Atransientm