DLT848152004高压试验装置通用技术条件

DL/T848.1~DL/T848.52004Generaltechnicalspecificationofhighvoltagetestdevices2004-03-092004-06-011DL/T848.120041DL/T848.220042DL/T848.320043DL/T848.420044DL/T848.5200452DL/T848.120041GeneraltechnicalspecificationofhighvoltagetestdevicesPat1highvoltageDCgenerator2004-03-092004-06-01312345678942000[2000]70DL/T848512345DL/T8481511DL/T8482DL/T848GB191EQVISO7801997GB/T2424.11989GB/T2424.21993EQVIEC60068-2-281990GB/T2900.191994GB/T6587.21986GB/T6587.31986GB/T6587.41986GB/T6587.51986GB/T6587.61986GB/T16927.119971GJB/J265819961100kV3GB/T2900.19DL/T8483.16ratedoutputvoltage3.2ratedoutputcurrent3.3ratedoutputpower3.4highvoltageDCripple3.5highvoltageDCrandomfluctution3.6DChigh-voltageexcursion44.174.211kVmAW0kV~40kV402800kV~60kV6021200kV~80kV8021600kV~l20kV12022400kV~200kV20024000kv~300kV30039000kV~400kV400520000kV~600kV600530000kV~l000kV10005500055.1a0~40b85%258c1000md220V22V380V38Ve50Hz0.5Hz5.25.35.40.5%5.53%200A5.61%5.71.11min95.84.25.93min60min5.1055.115.125.12.11%5.12.2l0%1%5.12.35min1%5.13105.145.155.15.1GB/T6587.22GB/T2424.195.15.2GB/T6587.3GB/T2424.25.165.16.1GB/T6587.45.17GB/T6587.55.17.1GB/T6587.66.16.16.21120%40%60%80%100%6.30.520%40%60%80%100%6.41.110minGB/T16927.119975.3.16.53min60min6.6522kVF600.11200.022000.007126000.0036.710%50%100%GJB/J265819965.2.86.8GJB/J265819965.2.55min6.9GJB/J265819965.2.76.106.10.1GB/T6587.2GB/2424.16.10.2GB/T6587.3GB/T2424.26.116.11.1GB/T6587.46.11.2GB/T6587.56.11.3GB/T6587.67137.17.23315.36.125.46.235.56.345.76.455.85.96.565.106.675.126.785.126.895.126.9105.156.10115.166.117.37.4388.114abcabGB1918.28.38.4-5~+5090%9abcde15DL/T848.220042GeneraltechnicalspecificationofhighvoltagetestdevicesPat2powerfrequencyhighvoltagetestdevice2004-03-092004-06-0116123456789172000[2000]70DL/T848512345DL/T84821821DL/T8481000kV1000kV2DL/T848GB/T2681GB/T2682GB4793.11IDTIEC6010-11990GB/T110231989GB/T12501.219972GB/T16927.219972EQVIEC60060-21994JB/T54731991JB87491998JB/T96411999JJG314199419JJG49619963DL/T8483.1power-frequencyhighvoltagetestdevice3.2completedevice3.3prtialdevice3.4protectivedevice44.14.2205.1a-5~+40b+2590%cd1000m5.25.2.1a0.20.51235101520kVAb51015202530501001502002503004005006007501000kVA5.2.20.220.383610kV5.2.3151050751001502002503003755006007501000kV5.2.4210.10.20.250.5124A5.2.5abGB/Tl6927.2JJG314JB/T54735.35.31a+15%b+15%c+10%d+30%e15%f1%5.3.21.2lmin5.3.34%~12%15%JB87495.3.45.3.4.15.3.4.2UmUml.1522l0M20M5.3.4.3aJB/T9641JB8749b1.15c3kVlmin5.3.55.3.65%5.3.765K55K50KSF675Ko5.3.8280%lk/10kV80%5.3.9231%5.3.101h2/32/35.3.11a75%2%b1sc5%de66.16.23kV2500V10000M3kV5000V10000M6.324h10%6.46.5245%JJG314JJG4966.6a5%b3%c75%2%/s10s~l5s6.75.3.10.50.26.850%1/2460PD1Dmm25PkVA6.90.05MPa4h0.03MPaGB/Tl10236.10ablmin3min5min6.11ab5%cde6.12alh2/32/38hbc6.136.1450%~100%6.152s260.01s310%~80%6.1680%77.15~47.20.50.27.37.3.1a6.18.18.28.3b6.5c6.3d6.4e6.2f6.696.7h6.8i6.927j6.10k6.117.3.2a6.10b6.12c6.13d6.14e6.157.3.36.1688.1aGBl2501.2bc50kVA50kVA30kgdef28gGB/T2681GB/T2682GB4793.18.20.111S1mm2S2mm2S116S2=S1616S135S2=16S135S2=S1/2AaXxAX8.3abcdefg29hkVAikVjAk%lAmhnkgto99.19.29.39.4a-25~+40b90%c9.5a30bcdefDL/T848.320043GeneraltechnicalspecificationofhighvoltagetestdevicesPat3nonpartialdischargetestingtransformer312004-03-092004-06-011234567322000[2000]70DL/T848512345DL/T84833331DL/T8482DL/T848GB191EQVISO7801997GB1094.22EQVIEC6007621993GB1094.53BG/T89051996GB/T10237GB/T16927.119971JB/T5011991JB/T38371996334DL/T8483.1highvoltagewinding3.2lowvoltagewinding3.3energizingwinding3.4measuringwinding3.5ratedvoltageratio44.labJB/T3837354.2a351025305010015020025030040050060075010001500kVAob11kVAkVkV35103,10,35,50,6010,35,50,60,10010,35,50,60,100,1600.2,0.4255010010,35,50,60,100,160,25035,50,60,100,160,25035,50,60,100,160,250,4000.4,0.60.3,6,1015025050035,50,60,100,160,250,40050,60,100,160,250,400,550100,160,250,400,5500.4,0.60.3,6,10750*1000*15000*250,550,750250,550,1000750,15003,6,10*3655.1a1000m10002500ml000m~2500m4000m2500m~4000mb+40-5oc+2590%de5Ohzf5.2lhlh4h12/35.365K1000mGBl094.25.437a232kVmin1:,50:tHzfatHzfHz,40050min1:,50:tHzf31010153550506560781001251601852502754004405506057508251000110015001650a2t=120/s,15s3KV1min,50Hz0.633106201028b3pC30mincR601000Md50kVetg900.5%f30010-6g1000mGBl0237385.5a4%~12%18%110%bc44%+15+10+10+30101d55e50HzIE20.07f50kV~750kV1/5001/100039g50kpa20kPa12h70%1%5.6abcde+40+20-5f950kVAhi5.766.labc1d3e406615.672JB/T5011991895.5c)5.5d)3JB/T5011991104R60JB/T501199165.4c)5tgJB/T501199175.4d)5.4e)6JB/T89051996895.4f)5.5g)7JB/T5011991115.4a)8JB/T5011991115.4a)9JB/T5011991125.5a)5.5b5.5c10JB/T5011991135.5a)5.5b5.5c11JB/T501199155.5g)12JB1094.32003A5.4b)131hJB/T5011991155.25.314GB/T16927.11997625.5e)6.266.367417.1abcdefHzghikKAjkVkAl%m%nhokgt;pkgtqkgt;rabc%de%42fkgtg7.2GBl917.37.4DL/T848.42004434GeneraltechnicalspecificationofhighvoltagetestdevicesPat4triple-frequencytesttransformer2004-03-092004-06-011234567844A2000[2000]70DL/T84851234455DL/T8484A41DL/T848150Hz2DL/T84846GB191EQVISO7801997GB/T16927.119971JB87493DL/T8483.1triple-frequencytransformer150Hz3.2no-lodcharacteristic3.3loadchracteristic3.4distortionfa