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502004No.21,1,1,1,2,1,1(1.,116023;2.,116031):,,,(FEP),:;;;;;:TM249;V259.5;TQ323.7;TQ333.93:A:1009-9239(2004)02-0050-03InsulatingmaterialsforspacecraftwireandcableSUNCai-xia1,WANGFu-dong1,MALei1,XUJie1,LIUXiao-hai2,WANGAi-qin1,ZHANGTao1(1.DalianInstituteofChemicalPhysics,ChineseAcademyofSciences,Dalian116023,China;2.GanjingziBranchofDalianEnvironmentalProtectionBureau,Dalian116031,China)Abstract:Inthispaper,thepropertiesofthreekindsofusualinsulatingmaterials(polysiloxane,fluoro2carbonelastomerandpolyimide)forspacecraftarereviewed,especiallytheirresistibilitytoatomicoxygenisdiscussed.Thefuturedevelopmentofnewinsulatingmaterialsforspacecraftisprospected.Keywords:wireandcable;insulatingmaterial;polysiloxane;fluorocarbonelastomer;polyimide;spacecratf:2003-10-17:,,,,(Tel:0411-4379157,Email:suncx@dicp.ac.cn)1,[1](),21[26],[7],,,(3.0),,,,,,,,,KaptonÒ,,,[89]KaptonÒ,[10]3(NASA),,2[11]:2004No.2511(KaptonÒ)(TEFLONÒ)(TEFLONÒ)-(TEFZELÒ)(RTV-615),g/cm31.422.162.151.701.57,260260200150200,%4395953022,1kHz3.21.82.22.02.63.5,rads5109510551055107108:2(4.5ev)(KaptonÒ)(TEFLONÒ)(TEFLONÒ)(RTV-615)(10-24cm3/atom)3.00.050.0370.051.53.73/Al2O3/SiO2/Al/(10-24cm3/atom)3.00.050.0370.051.53.1,,,[12]Scialdone[13],RTV-615,C,Si,O,,,[14]3.2,(FEP),FEP(1)FEPC-C4.3eV,C-F5.5eV,C-C3.9eVFEP(-CF3-F)FEP,,FEP,C-FFEP30%5.5eV,FEPCF3nFFFFFFFxC-CC-C1TeflonÒFEP3.34.5ev,0.1mmKaptonÒ,400;,1mmKaptonÒ[15],,,[16,17],SiOxSiO2Al2O3KaptonÒ,34,(55)2004No.255(51)-,,,,2.9(1kHz),46%,1.18kg/cm3[18],NASA,[1920],,,NASA[1]WKhachen,etal.Aerospace-specificdesignguidelinesforelectricalinsulation[J].IEEETrans.Electr.Insul.,1993,(5):76886.[2]LDSchwartz,etal.Heatrelease,flammability,smokeandtoxichazardofvariousaircraftinsulatedwires[J].Proc.Int.Conf.FireSaf.,1999,(27):168185.[3]AHammoud,etal.Effectsofthermalandelectricalstressingonthebreakdownbehaviorofspacewiring[J].Annu.Rep.-Conf.Electr.Insul.Dielectr.Phenom.,1995:266269.[4],,.-,GF863-2-2-1-15[M].:,2001.[5],,.[P].CN1428360,2001-12-25.[6],,.[P].CN1428361,2001-12-27.[7]MACabey.Newsiliconerubbercableinsulationpromisescircuitintegrityinflamingenvironment[C].InternationalWireandCableSymposiumProceedings.1983:175.[8].[J].,1993,(6):3334.[9].[J].,1992,(2):1419.[10].[J].:,1995,(5):1722.[11]BA.Banks,etal.Atomicoxygeneffectsonmaterials[C].NASAConferencePublication3035,1988.[12]JA.Dover.Lowearthorbitalatomicoxygenandultravioletradiationeffectsonpolymers[R].NASATM103711,1991.[13]J.J.ScialdoneandC.H.Clatterbuck.Fourspaceapplicationmaterialcoatingsonthelongdurationexposureflight[R].NASATM104574,1993.[14]B.A.Banks,etal.LDEF69monthsinspace[C].ProceedingsofNASA1stPostSymposium.1991:108.[15],,,.(),GF863-2-2-1-15[M].:,2000.[16]PWKnopf,etal.Correlationoflaboratoryandflightdatafortheeffectsofatomicoxygenonpolymericmaterials[C].AIAA20thThermophysicsConference.Williamsburg,VA,1985.[17]B.A.Banks,etal.Ionbeamsputter-depositedthinfilmcoatingsfortheprotectionofthespacecraftpolymersinlowearthorbit[C].23rdAerospaceSciencesMeeting.Reno,Nevada,1985.[18]MaguireG.[J]WireJournalInternational,1989,(10):7284.[19]ANHammoud,etal.Performanceofpartiallyfluorinatedpolyimideinsulationforaerospaceapplications[J].Annu.Rep.-Conf.Electr.Insul.Dielectr.Phenom.,1995:262265.[20]G.A.Slenski.Newinsulationconstructionsforaerospacewiringapplications[R].N95-16056,1994.:4,:,,,,,,,,,,,,[1],.[M].:,2000.[2]PohlHA.Dielectrophoresis[M].Cambridge:Cam-bridgeUniversityPress,1978.[3]JonesTB.Electromechamicsofparticles[M].Cambridge:CambridgeUniversityPress,1995,533.[4]PethigR.Dielectricandelectronicpropertiesofbiologicalmaterials[M].J.Wiley&Sons,1979,186206.[5]MarkxGH,TalaryMS,PethigR.Separationofviableandnon-viableyeastusingdielectroph-oresis[J].JBiotechnology,1994,32(1):2934.[6]PethigR.Dielectrophoresis:usinginhomogeneo-usACelectricalfieldstoseparateandmanipulatecells[J].Crit.Rev.Biotechnology,1996,(16):331348.[7]SandersGHW,ManzA.Chip-basedMicrosystemsforgenomicandproteomicanalysis[J].TredsAnalChem,2000,19(6):364378.[8]PethigR,MarkxG.H.Applicationsofdielectrophoresisinbiotech-nology[J].TrendsinBiotechnology,1997,(15):426432.[9]ChengJ,FortinaP,SorreyS,etal.Microchip-baseddevicefirmolecularofgeneticdisease[J].MolecularDiagnosis,1996:(1),183190.[10]BurtJ.P..H.,ChanK.L.,Dawson,D.,PartonA.,PethigR.AssaysformicrobialcontaminationandDNAanalysisbasedonelectrorotation[J].Ann.Biol.Clin,1996,(54):253257.
本文标题:空间飞行器用电线电缆绝缘材料
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