ANSI IEEE Std 930-1987 statistical analysis of ele

ANSI/IEEEStd930-1987AnAmericanNationalStandardIEEEGuidefortheStatisticalAnalysisofElectricalInsulationVoltageEnduranceDataSponsorStatisticalTechnicalCommitteeoftheIEEEDielectricsandElectricalInsulationSocietyApprovedJune19,1986IEEEStandardsBoardApprovedNovember17,1986AmericanNationalStandardsInstitute©Copyright1987TheInstituteofElectricalandElectronicsEngineers,Inc345East47thStreet,NewYork,NY10017,USANopartofthispublicationmaybereproducedinanyform,inanelectronicretrievalsystemorotherwise,withoutthepriorwrittenpermissionofthepublisher.IEEEStandardsdocumentsaredevelopedwithintheTechnicalCommitteesoftheIEEESocietiesandtheStandardsCoordinatingCommitteesoftheIEEEStandardsBoard.Membersofthecommitteesservevoluntarilyandwithoutcompensation.TheyarenotnecessarilymembersoftheInstitute.ThestandardsdevelopedwithinIEEErepresentaconsensusofthebroadexpertiseonthesubjectwithintheInstituteaswellasthoseactivitiesoutsideofIEEEwhichhaveexpressedaninterestinparticipatinginthedevelopmentofthestandard.UseofanIEEEStandardiswhollyvoluntary.TheexistenceofanIEEEStandarddoesnotimplythattherearenootherwaystoproduce,test,measure,purchase,market,orprovideothergoodsandservicesrelatedtothescopeoftheIEEEStandard.Furthermore,theviewpointexpressedatthetimeastandardisapprovedandissuedissubjecttochangebroughtaboutthroughdevelopmentsinthestateoftheartandcommentsreceivedfromusersofthestandard.EveryIEEEStandardissubjectedtoreviewatleastonceeveryÞveyearsforrevisionorreafÞrmation.WhenadocumentismorethanÞveyearsold,andhasnotbeenreafÞrmed,itisreasonabletoconcludethatitscontents,althoughstillofsomevalue,donotwhollyreßectthepresentstateoftheart.UsersarecautionedtochecktodeterminethattheyhavethelatesteditionofanyIEEEStandard.CommentsforrevisionofIEEEStandardsarewelcomefromanyinterestedparty,regardlessofmembershipafÞliationwithIEEE.Suggestionsforchangesindocumentsshouldbeintheformofaproposedchangeoftext,togetherwithappropriatesupportingcomments.Interpretations:OccasionallyquestionsmayariseregardingthemeaningofportionsofstandardsastheyrelatetospeciÞcapplications.WhentheneedforinterpretationsisbroughttotheattentionofIEEE,theInstitutewillinitiateactiontoprepareappropriateresponses.SinceIEEEStandardsrepresentaconsensusofallconcernedinterests,itisimportanttoensurethatanyinterpretationhasalsoreceivedtheconcurrenceofabalanceofinterests.ForthisreasonIEEEandthemembersofitstechnicalcommitteesarenotabletoprovideaninstantresponsetointerpretationrequestsexceptinthosecaseswherethematterhaspreviouslyreceivedformalconsideration.Commentsonstandardsandrequestsforinterpretationsshouldbeaddressedto:Secretary,IEEEStandardsBoard345East47thStreetNewYork,NY10017USAiiiForeword(ThisForewordisnotapartofANSI/IEEEStd930-1987,IEEEGuidefortheStatisticalAnalysisofElectricalInsulationVoltageEnduranceData.)ThisdocumentistheÞrstversionofaguidetopromotestandardizedmethodsforthestatisticalanalysisofdatafromvoltageendurancetestsonelectricalinsulation.SimplemethodstocalculateconÞdenceintervalshavereceivedspecialattention.WestronglyencourageusersofthisguidetocalculateconÞdenceintervalsfortheirtestdata,asthiswillhelpinterestedpartiesinevaluatingtheprecisionofthetests.Muchworkremainstobedoneinextrapolatingtheresultsoftestsfromacceleratedconditionstonormaloperatingstress(Section6).ThefollowingmembersoftheStatisticsTechnicalCommitteeoftheIEEEDielectricsandElectricalInsulationSocietyhavecontributedtothedevelopmentofthisguideH.Rosen,ChairP.E.AlexanderA.BulinskiT.L.ClaussenT.W.DakinE.M.FortJ.C.FothergillH.N.GalpernJ.F.LawlessW.NelsonG.C.StoneG.A.VincentB.E.WardW.D.WilkensThefollowingpersonswereontheballotingcommitteethatapprovedthisdocumentforsubmissiontotheIEEEStandardsBoard:G.C.Stone,ChairP.E.AlexanderA.BulinskiT.L.ClaussenT.W.DakinE.M.FortJ.C.FothergillH.N.GalpernJ.F.LawlessW.NelsonH.RosenG.A.VincentB.E.WardWhentheIEEEStandardsBoardapprovedthisstandardonJune19,1986,ithadthefollowingmembership:JohnE.May,ChairIrvingKolodny,ViceChairSavaI.Sherr,SecretaryJamesH.BeallFletcherJ.BuckleyPaulG.CummingsDonaldC.FleckensteinJayForsterDanielL.GoldbergKennethD.HendrixIrvinN.HowellJackKinnJosephL.Koepfinger*EdwardLohseLawrenceV.McCallDonaldT.Michael*MarcoW.MigliaroStanleyOwensJohnP.RiganatiFrankL.RoseRobertE.RountreeMarthaSloanOleyWanaseljaJ.RichardWegerWilliamB.WilkensHelenM.WoodCharlesJ.WylieDonaldW.Zipse*MemberemeritusivCLAUSEPAGE1.ScopeandReferences.........................................................................................................................................11.1Scope..........................................................................................................................................................11.2References..................................................................................................................................................12.Introduction.........................................................................................................................................................22.1StepsRequiredtoAnalyzeVoltage-AgingData...