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IEEEStd323™-2003(RevisionofIEEEStd323™-1983)IEEEStandards323TMIEEEStandardforQualifyingClass1EEquipmentforNuclearPowerGeneratingStationsPublishedbyTheInstituteofElectricalandElectronicsEngineers,Inc.3ParkAvenue,NewYork,NY10016-5997,USA23January2004IEEEPowerEngineeringSocietySponsoredbytheNuclearPowerEngineeringCommitteeIEEEStandardsPrint:SH95169PDF:SS95169CopyrightTheInstituteofElectricalandElectronicsEngineers,Inc.ProvidedbyIHSunderlicensewithIEEENotforResaleNoreproductionornetworkingpermittedwithoutlicensefromIHS--``,```-`-`,,`,,`,`,,`---RecognizedasanAmericanNationalStandard(ANSI)TheInstituteofElectricalandElectronicsEngineers,Inc.3ParkAvenue,NewYork,NY10016-5997,USACopyright©2004bytheInstituteofElectricalandElectronicsEngineers,Inc.Allrightsreserved.Published23January2004.PrintedintheUnitedStatesofAmerica.IEEEisaregisteredtrademarkintheU.S.Patent&TrademarkOffice,ownedbytheInstituteofElectricalandElectronicsEngineers,Incorporated.Print:ISBN0-7381-3812-6SH95169PDF:ISBN0-7381-3813-4SS95169Nopartofthispublicationmaybereproducedinanyform,inanelectronicretrievalsystemorotherwise,withoutthepriorwrittenpermissionofthepublisher.IEEEStd323™-2003(RevisionofIEEEStd323-1983)IEEEStandardforQualifyingClass1EEquipmentforNuclearPowerGeneratingStationsSponsorNuclearPowerEngineeringCommitteeoftheIEEEPowerEngineeringSocietyApproved3February2004AmericanNationalStandardsInstituteApproved11September2003IEEE-SAStandardsBoardAbstract:ThebasicrequirementsforqualifyingClass1Eequipmentandinterfacesthataretobeusedinnuclearpowergeneratingstationsaredescribedinthisstandard.Theprinciples,methods,andproceduresdescribedareintendedtobeusedforqualifyingequipment,maintainingandextendingqualification,andupdatingqualification,asrequired,iftheequipmentismodified.Thequalificationrequirementsinthisstandard,whenmet,demonstrateanddocumenttheabilityofequipmenttoperformsafetyfunction(s)underapplicableserviceconditionsincludingdesignbasisevents,reducingtheriskofcommon-causeequipmentfailure.Keywords:ageconditioning,aging,conditionmonitoring,designbasisevents,equipmentqualification,harshenvironment,margin,mildenvironment,qualificationmethods,qualifiedlife,radiation,safetyrelatedfunction,significantagingmechanism,testplan,testsequence,typetestingCopyrightTheInstituteofElectricalandElectronicsEngineers,Inc.ProvidedbyIHSunderlicensewithIEEENotforResaleNoreproductionornetworkingpermittedwithoutlicensefromIHS--``,```-`-`,,`,,`,`,,`---TheInstituteofElectricalandElectronicsEngineers,Inc.3ParkAvenue,NewYork,NY10016-5997,USACopyright©2004bytheInstituteofElectricalandElectronicsEngineers,Inc.Allrightsreserved.Published23January2004.PrintedintheUnitedStatesofAmerica.IEEEisaregisteredtrademarkintheU.S.Patent&TrademarkOffice,ownedbytheInstituteofElectricalandElectronicsEngineers,Incorporated.Print:ISBN0-7381-3812-6SH95169PDF:ISBN0-7381-3813-4SS95169Nopartofthispublicationmaybereproducedinanyform,inanelectronicretrievalsystemorotherwise,withoutthepriorwrittenpermissionofthepublisher.CopyrightTheInstituteofElectricalandElectronicsEngineers,Inc.ProvidedbyIHSunderlicensewithIEEENotforResaleNoreproductionornetworkingpermittedwithoutlicensefromIHS--``,```-`-`,,`,,`,`,,`---IEEEStandardsdocumentsaredevelopedwithintheIEEESocietiesandtheStandardsCoordinatingCommitteesoftheIEEEStandardsAssociation(IEEE-SA)StandardsBoard.TheIEEEdevelopsitsstandardsthroughaconsensusdevelop-mentprocess,approvedbytheAmericanNationalStandardsInstitute,whichbringstogethervolunteersrepresentingvariedviewpointsandintereststoachievethefinalproduct.VolunteersarenotnecessarilymembersoftheInstituteandservewithoutcompensation.WhiletheIEEEadministerstheprocessandestablishesrulestopromotefairnessintheconsensusdevelopmentprocess,theIEEEdoesnotindependentlyevaluate,test,orverifytheaccuracyofanyoftheinformationcon-tainedinitsstandards.UseofanIEEEStandardiswhollyvoluntary.TheIEEEdisclaimsliabilityforanypersonalinjury,propertyorotherdam-age,ofanynaturewhatsoever,whetherspecial,indirect,consequential,orcompensatory,directlyorindirectlyresultingfromthepublication,useof,orrelianceuponthis,oranyotherIEEEStandarddocument.TheIEEEdoesnotwarrantorrepresenttheaccuracyorcontentofthematerialcontainedherein,andexpresslydisclaimsanyexpressorimpliedwarranty,includinganyimpliedwarrantyofmerchantabilityorfitnessforaspecificpurpose,orthattheuseofthematerialcontainedhereinisfreefrompatentinfringement.IEEEStandardsdocumentsaresupplied“ASIS.”TheexistenceofanIEEEStandarddoesnotimplythattherearenootherwaystoproduce,test,measure,purchase,market,orprovideothergoodsandservicesrelatedtothescopeoftheIEEEStandard.Furthermore,theviewpointexpressedatthetimeastandardisapprovedandissuedissubjecttochangebroughtaboutthroughdevelopmentsinthestateoftheartandcommentsreceivedfromusersofthestandard.EveryIEEEStandardissubjectedtoreviewatleasteveryfiveyearsforrevi-sionorreaffirmation.Whenadocumentismorethanfiveyearsoldandhasnotbeenreaffirmed,itisreasonabletoconcludethatitscontents,althoughstillofsomevalue,donotwhollyreflectthepresentstateoftheart.User
本文标题:ANSIIEEE 323-2003 核电站1E级设备的质量鉴定
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