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20081No.12008ElectricWire&Cable20082Feb.,2008BDD22(,200093):BDD22,,,,GB/T3048.321994:BDD22;;;;;:TM206:A:167226901(2008)0120013203DevelopmentoftheBDD22TestApparatusforResistanceMeasurementfortheSemicondutiveLayerinCablesYUZhen2ming(ShanghaiElectricCableResearchInstitute,Shanghai200093,China)Abstract:Thispaperpresentsthecharacteristicsoftheresistancemeasurementforthesemiconductivelayerincables(mainlythespecialrequirementsforthetestapparatusaswellasmeasuringpower,range,resolutionandthetech2niquestousetheapparatus),takingBDD22TestApparatusasanexample.Theuseof42plusyearsbytheNationalSupervisionandTestingCentreforWireandCableandinspectionbytheInspectionCentrefortheTestApparatusforWireandCableprovedthattheapparatuscompliesfullywiththetechnicalrequirementsofGB/T3048.321994fortestapparatus.Keywords:BDD22TestApparatusforresistancemeasurementforthesemicondutivelayerincables;measuringrangeandresolution;measuringpower;inputimpedance;insulationresistancetoearth;temperaturecompensation:2007209210:(1949-),,.:1000[200093].0,,,,GB/T3048.3,GB/T3048.3GB/T3048.3,1012,,,,,,,,,,,,,GB1101721989GB/T1270622002,,3.6/6kV10mm2,,,200k,,,2M,1010(GB/T3048.3108,),BDD22BDD22:GB/T3048.3,;,,GB/T3048.3,0.5%FS2d(0.5%2),,BDD22200211,GB/T3048.3,11.1BDD22,,,41/2,BDD22:2M200k20k2k1A10A100A1mA,,1A,,,41/231/2,2k,0.1,1.2GB/T3048.3,,0.1WBDD22,2k,1mA,210-3W1.3,41/2ICL7135A/D,ICL7135JFET,1012,,1010,2M,1.4BDD221012,GB/T3048.3,,BDD22220V22,1010,22,1011,,BDD22,41/2,,,1012,1012,A/D,,10121.51A,,,10,5%,,PN,,10,0.1%22.1BDD22,1012,,,,,,,10101011,,,,,,,,,2.2,BDD222M,10A,,4120081No.12008ElectricWire&Cable20082Feb.,200820V,40V,,,1A2M,2M,4V,,,(VBE,VGS,,gm,ICBO),VBE-2mV/,/0.5%/,ICBO10,,,(510)nA/,,1A,10,50nA,5%,,,,,,,PN,,,,,,,,100VD,VD0.6V-2.5mV/+(68)%5%,,,,20,,30,,,20,,,,BDD22,2M1A,(1030),50ppm(1ppm=10-4%),,2.3BDD22,:(1),:,,,,,;(2),,,;(3)2k,(0.51)min,;(4)BDD22,,,;(5),,,3,:GB/T12706.222002,(),6M,BDD22,,,:[1].[M].,1981.[2]GB/T3048.321994.[S].[3]GB1101721989,110kV[S].[4]GB/T12706.222002,1kV35kV2:6kV30kV[S].[5].2()[J].,2007,(8):9211.5120081No.12008ElectricWire&Cable20082Feb.,2008
本文标题:BDD_2型电缆半导电电阻测量装置的研制
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