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统计过程控制StatisticalProcessControl设备能力指数人员机器材料方法测量环境过程普通原因变差许多偶然原因的合成mkC设备能力指数根据美国工业界的经验,长期的过程变差的75%来自设备变差,设备能力指数Cmk表示仅由设备普通原因变差决定的能力,与公差和生产设备的加工变差有关,设备能力指数只考虑短期的变差,尽可能地排除对过程有影响而与设备无关的因素。machineLSLUSLCmˆ6不考虑加工中心的偏移:),(machinemachineLSLxxUSLMinCmkˆ3ˆ3考虑加工中心的偏移:machinexUSLCmkˆ3只有公差上限:只有公差下限:machineLSLxCmkˆ3至少连续50件的数据s估计的sigma或用连续50件的数据任意分组后的Rbar/d2估计的sigma来计祘mkC设备能力指数时间更按换的材料批号变差机器变差设备能力研究mkC设备能力指数设备能力研究与过程能力研究的不同不在于计祘方法,而在于取样条件和方法。质量特性值过程能力研究至少连续取50件的数据,排除3M1E变差组内连续取4-6件,至少25组尽量包括4M1E变差24,ˆsscss其中修偏系数与是与样本无关,而与样本容量有关的常数,其部分值列在附表中。d2c4n正态标准差的无偏估计xxRdRRminmax2,ˆkRRdRiR,ˆ2R估计样本小于9R估计样本大于9,分组后用Rbar估计s估计1)(22nxxsi过程变差的75%来自设备变差processmachineˆ43ˆmachineLSLUSLCmkˆ6processLSLUSLCpˆ6至少连续取50件的数据,排除3M1E变差组内连续取4-6件,至少25组尽量包括4M1E变差processLSLUSLCmkˆ5.4machineLSLUSLCpˆ8CmkCpk43过程变差&设备变差设备能力研究时机设备能力研究为过程能力研究提供分析数据,在设备鉴定的依据在设备包括模具新购时,在使用以前,应验证其能力,在下列情况下重复能力研究:新产品维修后(对产品有影响)新的模具/设备机器搬迁后公差缩紧长期停产以后加工过程/输出状态的更改mkC设备能力指数在设备能力研究时,机器应该同模具,必要时同一体化的检具和调整装置一起被视为一个整体。设备能力指数是短期变差,能力指数至少应该Cmk=1.67。不足时,必须采取纠正措施,措施完成后实施新的设备能力研究。样本量与能力指数置信区间关系1112/^12/1^npCCpnpCnn1219111219112^2/^2^2/^npkCnZpkCCpknpkCnZpkC能力指数估计的置信区间)1(100设备能力研究至少取连续生产50件产品的质量特性值数据。0.600.580.560.540.520.50USLLSLLSL0.5Target*USL0.6SampleMean0.5476SampleN50StDev(Within)0.0193035StDev(Overall)0.0186244ProcessDataLowerCL0.72UpperCL1.07PPL0.85PPU0.94Ppk0.85LowerCL0.66UpperCL1.04Cpm*LowerCL*Cp0.86LowerCL0.66UpperCL1.06CPL0.82CPU0.90Cpk0.82LowerCL0.61UpperCL1.03Pp0.89OverallCapabilityPotential(Within)CapabilityPPMLSL0.00PPMUSL0.00PPMTotal0.00ObservedPerformancePPMLSL6834.03PPMUSL3318.49PPMTotal10152.52Exp.WithinPerformancePPMLSL5297.39PPMUSL2450.16PPMTotal7747.55Exp.OverallPerformanceWithinOverallProcessCapabilityofC1(using95.0%confidence)0.6000.5850.5700.5550.5400.5250.510LSLUSLLSL0.5Target*USL0.6SampleMean0.5476SampleN100StDev(Within)0.0193035StDev(Overall)0.0184824ProcessDataLowerCL0.78UpperCL1.03PPL0.86PPU0.95Ppk0.86LowerCL0.72UpperCL0.99Cpm*LowerCL*Cp0.86LowerCL0.72UpperCL1.00CPL0.82CPU0.90Cpk0.82LowerCL0.67UpperCL0.97Pp0.90OverallCapabilityPotential(Within)CapabilityPPMLSL0.00PPMUSL0.00PPMTotal0.00ObservedPerformancePPMLSL6834.03PPMUSL3318.49PPMTotal10152.52Exp.WithinPerformancePPMLSL5005.91PPMUSL2290.37PPMTotal7296.28Exp.OverallPerformanceWithinOverallProcessCapabilityofC13(using95.0%confidence)样本尺寸(件数)最小Pp值﹡Pp≥1.33Pp≥1.67Pp≥1.81Pp≥2.00101.682.122.332.54201.592.002.202.40401.521.902.092.28501.501.882.062.2560~1251.461.842.042.20--仅对克莱斯勒使用-----------------设备条件指南工装与设备初始过程能力Pp值对应各种不同的样本尺寸有不同的最小Pp值是必然的,这归因于把抽样风险与小样本联系起来。假设:表中数值是从样本中随机抽样,通常服从正态分布。设备条件指南工装与设备初始过程能力Ppk值最小Ppk值﹡样本尺寸Ppk≥1.33Ppk≥1.67Ppk≥1.81Ppk≥2.00100.88-1.851.12-2.341.24-2.591.36-2.83201.03-1.631.30-2.051.43-2.261.57-2.47301.08-1.561.37-1.961.51-2.161.65-2.36401.12-1.521.41-1.911.55-2.101.70-2.30501.14-1.491.43-1.881.58-2.071.73-2.26601.15-1.481.45-1.851.60-2.041.75-2.23701.17-1.471.47-1.841.62-2.031.77-2.21801.18-1.461.48-1.831.63-2.011.78-2.201001.19-1.441.50-1.811.65-1.991.80-2.171251.21-1.431.52-1.791.67-1.971.82-2.15计祘Cmk流程消除人料法环变差因素FMEA及变差模型连续生产并采集数据直方图检查异常原因计祘Cmk采取纠正措施重新计祘Cmk正态性检验mkC设备能力指数1234567891010.5970.5460.5270.5570.5380.5540.5580.5600.5510.54120.5320.5500.5450.5490.5570.5500.5480.5330.5340.53430.5520.5300.5130.5290.5170.5620.5320.5380.5440.54440.5420.5640.5570.5390.5210.5400.5700.5670.5370.53750.5770.5140.5250.5910.5680.5370.5670.5570.5740.574一台自动车床加工新规格的轴,对夹具、刀具进行了调整后,为验证其能力,取连续生产50件的轴直径数据进行设备能力研究,数据如下表,轴直径规格为0.55±0.05cm。直方图检查异常原因GraphHistogramchooseSimpleOKMINITAB操作直方图检查异常原因直方图检查,发现异常原因,必须采取纠正措施,措施完成后实施新的设备能力研究。C1Frequency0.600.580.560.540.52121086420HistogramofC1123456789051015频次123456789100101234567891001020正常型右偏型平顶型常见的直方图频次12345678901020左偏型频次频次常见的直方图12345678901020孤岛型频次2345678910110510锯齿型频次1234567891011051015双峰型频次123456789051015U字型频次Anderson-Darling正态性检验P值C1Percent0.600.580.560.540.520.50999590807060504030201051Mean0.5476StDev0.01853N50AD0.244P-Value0.753ProbabilityPlotofC1NormalP值小于0.05,则数据不服从正态分布,其置信度是95%1ChooseStatBasicStatisticsNormalityTest.2InVariable,enterC1.ClickOK.MINITAB操作1ChooseStatQualityToolsCapabilityAnalysisNormal.2InSinglecolumn,C1.InSubgroupsize,enter5.3InLowerspec,enter0.50.InUpperspec,enter0.60.ClickOKMINITAB操作0.600.580.560.540.520.50LSLUSLLSL0.5Target*USL0.6SampleMean0.5476SampleN50StDev(Within)0.0193035StDev(Overall)0.0186244ProcessDataCp0.86CPL0.82CPU0.90Cpk0.82Pp0.89PPL0.85PPU0.94Ppk0.85Cpm*OverallCapabilityPotential(Within)CapabilityPPMLSL0.00PPMUSL0.00PPMTotal0.00ObservedPerformancePPMLSL6834.03PPMUSL3318.49PPMTotal10152.52Exp.WithinPerformancePPMLSL5297.39PPMUSL2450.16PPMTotal7747.55Exp.OverallPerformanceWithinOverallProcessCapabilityofC1
本文标题:CMK设备能力指数培训
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