您好,欢迎访问三七文档
边界扫描简介BY:SUNNYMOK可测性设计•由于线路越来越复杂,大型的IC要做全功能测试的可能性越来越低(因全功能检查时间太长)•在生产的角度来看,关心工艺问题要比工程问题为重要•产品有错或不乎指标,工程修改•IC的开短路,IC的质量,是生产最关心的问题。•在测试IC脚之间的短路,只需要在IC每一跟脚下一根针便能检测可测性设计•IC的浮接只能通过保护二极管,eScan,TestJet等方法去解决•此等测试为非带电测试,稳定性,及可测范围都受到一定影响•为此有一些IC供应商提供另外的解决方案•NandTree与BoundayScan边界扫描结构基本讯号:TDI,TDO,TMS,TCK,TRST*PITAPCONTROLLERTRST*TDITMSTDOTCKLOGICSOSIPOInfrastructureTests•扫描链连接测试•TAP控制器测试•漏件•错件InfrastructureTests•扫描链连接测试•TAP控制器测试•漏件•错件InterconnectionTests•Stuck0/1•开短路•连接器InterconnectionTests•Stuck0/1•开短路•连接器Clustering•功能测试•记忆体测试Clustering•功能测试•记忆体测试FunctionalTests•同步罗揖•非同步罗揖FunctionalTests•同步罗揖•非同步罗揖JTAG能测什么?边界扫描测试目标•BS元件与BS元件之间试其相连的元件之生产工艺缺陷•静电做成的损害•机械故障(脚变形,错件,...)•热故障(空焊,连焊..)•BS测试可包括连接器JTAG完整结构CoreLogicTAPControllerTCKTMSTRST(Optional)InternalScanBypassIDRegisterInstructionRegisterTDOTestDataOutputTestDataInputTDITestprincipleJTAGInterfaceboardJTAGInterfaceboardTestPCTestPCUnitUnderTestUnitUnderTest由原理圖到由原理圖到JTAGJTAG設計者有甚麼地方必須考慮設計者有甚麼地方必須考慮特殊佈線上拉/下拉元件靜態傳導元件+動態傳導元件外接插頭佈線清單必須與週邊素描敘述,語言的資料配合-元件名稱-腳編號式腳名稱-腳流程方向OE佈線及測試函數的處理佈線及測試函數的處理應用於測試基本結構及內連線測試應用於測試基本結構及內連線測試測試規律選項測試函數文檔Control.GEN(用於基本結構測試).APL(用於內連線測試)佈線清單文檔BSDL文檔控制資訊回流週邊閃存測試程式生成器實際上週邊實際上週邊掃掃描的描的好處好處真實工作匯報例:v測試生成時間,從1個月減至5分鐘v測試及調試,從1週半減至5小時v針床覆蓋率提升,由40%增至95%v搜索問題需用時間,由1小時減至5分鐘v測試維修及支援時間,每月由30分鐘減至5分鐘v未定案設測試可達90%的覆蓋率v試產後,未定案的產品發還給原設計者可在48小時內完成測試用的真值表報告器PM3790測試用的週邊掃描診斷工具套件•基本結構測試•內連線測試•內存群組測試•其他群組測試編程用的編程流程報告器•及格/不及格流程錯誤尋找T800FV边界扫描介面T800FV边界扫描•TMSCH:TosetthetestchannelforTMSpin•TCKCH:TosetthetestchannelforTCKpin•TDICH:TosetthetestchannelforTDIpin•TDOCH:TosetthetestchannelforTDOpin•TCKFreq:TosettheclockrateforBoundaryScanTestT800FV边界扫描•DeviceName:Tosetdevicename•LoadBSDL:ToLoadtheBSDLFileoftheBoundaryScanIC•FilePath:ActiveIC:ToEnabletheBoundaryScanIC•ToshowthepathoftheBSDLFile•PartType:ToshowtheparttypeoftheBoundaryScanICT800FV边界扫描•IDCode:ToshowtheIDCodeoftheBoundaryScanIC•Ins.Len.:ToshowthelengthoftheInstructionCode•Ins.Code:ToshowtheavailableInstructionCode•DataLength:ToshowthedatalengthoftheBoundaryScanICT800FV边界扫描•DataBit:ToshowthedatabitoftheBoundaryScanIC•InterconnectionTable:TosettheinterconnectionbetweenboundaryscanICsontheUUTT800FV边界扫描-测试种类•GetIDCode~TogettheIDCodeoftheBoundaryScanIC•InterconnectionTest~TochecktheOpen/ShortbetweenBoundaryScanICs•InputScanTest~TochecktheOpen/ShortoftheinputpinsofBoundaryScanICs.ItneedsexternaldigitalI/Otodrivetheinputsignal•OutputDriveTest~TochecktheOpen/ShortoftheoutputpinsifBoundaryScanICs.ItneedsexternaldigitalI/OtoreadtheoutputsignalT800FV边界扫描-指令•BSN”~ToturnontheBoundaryScanBusandresettheBus•“IDC”~TogettheIDCodeoftheBoundaryScanICs•“ITC”~TochecktheOpen/ShortoftheinterconnectionpinsbetweenBoundaryScanICs•“SIC”~TosettheinstructioncodeoftheBoundaryScanICsT800FV边界扫描-指令•“SDC”~TosetthedatacodeoftheBoundaryScanICs•“RDC”~ToreadthedatacodeoftheBoundaryScanICs•“IO”~TosetthedigitalI/OforBoundaryScantest•“RI”~ToreadthedigitalI/OforBoundaryScantestT800FV编程介面演示演示Demoboard演示边界扫描的培训•收费培训•工程设计•BS原理•软件使用•项目编程(示范板)•错误分析及报告TAPControllerStateMachine110100111010000111011TestLogicResetRunTest/IdleSelectDRCaptureDR0ShiftDRExit1DR0PauseDRExit2DRUpdateDR10101SelectIRCaptureIR0ShiftIRExit1IR0PauseIRExit2IRUpdateIR10•Statemachineof16states•About100gates•Composedofdifferentregisters•IscontrolledbyTMS,TCKandTRST•ControlstheDataflow•Statemachineof16states•About100gates•Composedofdifferentregisters•IscontrolledbyTMS,TCKandTRST•ControlstheDataflowValuesofTMSforarisingedgeofTCKValuesofTMSforarisingedgeofTCK
本文标题:边界扫描技术
链接地址:https://www.777doc.com/doc-3381856 .html