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60PrintedCircuitInformationCommonElectronicComponentsFailureMechanismandFaultAnalysisWANGWeiAbstractTheelectronicprimarydeviceintheuseprocess,frequentlycanappeartheexpirationandthebreakdown,thusaffectstheequipmentthenormalwork.Thisarticlehasanalyzedthecommonprimarydeviceexpirationreasonandthecommonbreakdown.Keywordsexpires;breakdown;mechanismSMT61PrintedCircuitInformationSummarization&CommentSMTSummarization&Comment62PrintedCircuitInformationΩΩμΩμμμΩΩΩΩSMT63PrintedCircuitInformationSummarization&CommentPCIPCISMT
本文标题:常见电子元器件的失效机理与故障分析
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