可溯源冲击电压校准器特性研究

，，，，430074：IEC60060-1———2010《》、4。＜0.1%＜0.5%。：：A：1674-5124（2016）01-0031-04PerformanceanalysisforatraceableimpulsevoltagegeneratorLIWentingLIUShaoboLONGZhaozhiXIAOKaiZONGXianweiChinaElectricPowerResearchInstituteWuhan430074ChinaAbstract:ThispaperintroducesatraceableimpulsevoltagegeneratorwhichcangeneratestandardlightingimpulseandswitchimpulsewaveformsaccordingtoIEC60060———1∶2010.Itisusedtocalibratethetimeparametersandpeakvaluefordigitalrecorderanddigitalpeakvaluevoltmeter.Theestimateduncertaintyfortheimpulsepeakvalueislessthan0.1%andfortimeparameterslassthan0.5%.Itcanbetracedtonationalcompnentstandardbytheoreticalanalysis.Itcansatisfytheparameterscalibrationrequirementsofdigitalvoltmeteranddigitalrecorderusedformeasuringlightingwaveform.Itisofgreatpracticaluseandcanbeusedwidelyinimpulsemeasurementcalibration.Keywords:traceablestandardwaveformgeneratordigitalrecorderpeakvaluevolmeter：2015-04-19；：2015-06-111987-、。0[1-4][5]。[6]。HAEFELYStrauss[7-9]。11.1CHINAMEASUREMENT&TESTVol.42No.1January201642120161doi：10.11857/j.issn.1674-5124.2016.01.00720161VUSV1CLRLCCRDCbRERSLSKCSR12R11R01、、、、、。40.84μs/60μs、1.56μs/60μs、250μs/2500μs、20μs/4000μsIEC60060-1———2010。1≥0.3≤0.3%。1000V。、、、LabVIEW[10]、。。1.21IIIIIIIVV。、。R11、R12R11R12R12。CS、RE、RD、CbCL、RLLS、RS。CSKK。KCSSKSSKCSR11R12。SKMOSFETS40μsSK。1.3。、32421UpT1T2/%/%/%CS976.1553nF0.0720.0360.0025920.07670.00552240.9580.06897Cb9.670187nF0.058-0.036-0.0020880.810.046980.07120.004129RE81.9043Ω0.04750.030.0014250.0670.00318250.9580.045505RS0.3Ω10-0.0036-0.0360.0050.050.01890.189RD53.93556Ω0.048-0.0027-0.000130.810.038880.05450.002615LS250nH200.00030.006-0.01-0.2-0.0001-0.002CL139.5pF10-0.00085-0.00850.0040.040.00020.002RL1MΩ10.00030.00030.00010.00010.00010.0001UC100V0.01310.013----（k=2）-0.08-0.44-0.40/%11.56μs/60μs。Keithley2657A1/10000Agilent34401A1×10-5k=2。1.4。、、CSRE。KSK。1MΩ30pF2~10kΩ2kΩ2kΩ。、。。21.56μs/60μs1/T1/T21.5417μs/59.6425μs。UpT1/T2。。。51、、。2。3。4。5。、、1～45。1～51%、T1T2。。1。3320161/VUp/VT1/μsT2/μsΔU/U/‰Up/VT1/μsT2/μsΔU/U/‰109.99741.550759.8271-0.26-10.00261.549359.87020.263030.00431.552259.82870.143-30.00471.550759.84080.1565049.98731.552759.8152-0.254-50.02071.551759.82380.4148080.00111.538759.80440.014-80.03001.548959.80720.37510099.98401.545359.7996-0.16-100.0161.548559.80410.161150149.97401.540859.7835-0.173-149.9841.539759.7966-0.104200199.92891.540259.7678-0.356-199.9471.538559.7758-0.266300299.94461.543159.7804-0.185-299.9561.540859.7756-0.146400399.81191.541159.7270-0.47-399.8761.539559.7898-0.309500499.92691.539459.7239-0.146-499.9091.537959.7354-0.182600599.84481.53859.7219-0.259-599.8651.536859.7337-0.225700700.08851.542159.74230.126-700.0531.540859.75750.0756800799.89771.542759.7161-0.128-799.8391.541559.7789-0.201900900.18791.540459.72110.209-899.9621.538259.7467-0.04210001000.0071.540959.70930.007-999.6171.53959.7862-0.3833-1.543259.7646--1.542859.7882-2CSRET2CbRDT1。1.56μs/60μs0.08%T10.44%T20.40%1。3Struass/TR-AS200-141000V-1.56μs/60μs10~1000V102。＜0.5‰T1/T2=1‰/2‰。。441.56μs/60μs≥2kΩ。、。LabVIEW10~1000V。。0.1%0.5%、。[1]High-voltagetesttechniquesPart1generaldefinitionsandtestrequirementsIEC60060-1———2010[S].2010.[2]High-voltagetesttechniquesPart2measuringsystemsIEC60060-2———2010[S].2010.[3].[J].201350566125-128.[4].[J].201350567124-128.[5]InstrumentsandsoftwareusedformeasurementsinhighvoltageimpulsetestsPart1requirementsforinstrumentsIEC61083-1———2001[S].2001.[6]JJG588———1996[S].1996.[7]HA咬LLSTRO咬MJAROMKIVELM.Lightningimpulsecalibrationcircuitforvoltagesupto1800V[C]∥Proc8thISHYokohama1993423-426.[8]HA咬LLSTRO咬MJCHEKUROVYAroM.Acalculableimpulsevoltagecalibratorforcalibrationofimpulsedigitizers[J].IEEETransactionsonInstrumentationandMeasurements200352400-403.[9]LIYSHEEHYRRUNGISJ.Thecalibrationofacalculableimpulsevoltagecalibrator[C]∥Proc10thISHMontreal199745-49.[10].LabVIEW[J].201246279-82.（：）34