各种可靠性试验参考标准

A2LAhasaccreditedSILICONCERTLABORATORIESReading,PAfortechnicalcompetenceinthefieldofMechanicalTestingThislaboratoryisaccreditedinaccordancewiththerecognizedInternationalStandardISO/IEC17025:2005GeneralRequirementsfortheCompetenceofTestingandCalibrationLaboratories.Thisaccreditationdemonstratestechnicalcompetenceforadefinedscopeandtheoperationofalaboratoryqualitymanagementsystem(refertojointISO-ILAC-IAFCommuniquédated8January2009).Presentedthis21stdayofSeptember2009._______________________President&CEOFortheAccreditationCouncilCertificateNumber2930.01ValidtoNovember30,2011Forthetestsortypesofteststowhichthisaccreditationapplies,pleaserefertothelaboratory’sMechanicalScopeofAccreditation.(A2LACert.No.2930.01)09/21/09Page1of3SCOPEOFACCREDITATIONTOISO/IEC17025:2005SILICONCERTLABORATORIES4201PottsvillePike,Building4AReading,PA19605AnnePoncheriPhone:[phone]MECHANICALValidTo:November30,2011CertificateNumber:2930.01InrecognitionofthesuccessfulcompletionoftheA2LAevaluationprocess,accreditationisgrantedtothislaboratorytoperformthefollowingtestsonComponentsandSubsystemsforOptoelectronics,Telecommunication,Military,Automotive,AerospaceandMedicalDevices:TestType/TechnologyTestMethod(s)AcceleratedBiasAge/BurnIn/LifeJESD22-A108MIL-STD-202,Method108MIL-STD-750,Methods1026,1038,1039,1040,1048MIL-STD-883,Methods1005,1015,1016,1030,1033HighTempStorage/StabilizationBakeJESD22-A103,Cond(AthruFandG)AEC-Q100,AEC-Q200GR-468-CORE(3.3.2.1)MIL-STD-202,Method108MIL-STD-750,Method1031MIL-STD-883,Method1008LowTemperatureStorageJESD22-A119,Cond(AthruC)GR-468-CORE(3.3.2.1)TemperatureCycleJESD22-A104MIL-STD-750,Methods1051and1055MIL-STD-883,Method1010GR-468-COREPowerTemperatureCycleJESD22-A105MIL-STD-883,Method1007ThermalShockJESD22-A106MIL-STD-750,Method1056MIL-STD-883,Method1011MIL-STD-202,Method107GDampHeat(85/85)GR-468-COREMIL-STD-202,Method103BHighlyAcceleratedStressTest(HAST)JESD22-A118(unbiased)JESD22-A110(biased)(A2LACert.No.2930.01)09/21/09Page2of3CyclicMoistureMIL-STD-883,Method1004MIL-STD-202,Method106GMIL-STD-750,Method1021MIL-STD-810,Method507JESD22-A100GR-1221-COREAutoclaveJESD22-A102TemperatureHumidityBias(THB)JESD22-A101BMIL-STD-202,Method103PreconditioningJESD22-A113AEC-Q100,AEC-Q101MoistureSensitivityLevel(MSL)J-STD-020J-STD-035CSAMSolderabilityJESD22-B102,Methods1and2JSTD-002AEC-Q100,AEC-Q101,AEC-Q200MIL-STD-883,Method2003MIL-STD-750,Method2026MechanicalShockJESD22-B104AEC-Q100,AEC-Q101,AEC-Q200GR-468-COREMIL-STD-883,Method2002MIL-STD-750,Method2016MIL-STD-202,Method213Cond(AthruFandJ)VariableFrequencyVibrationJESD22-B103AEC-Q100,AEC-Q101MIL-STD-883,Methods2007MIL-STD-750,Methods2056MIL-STD-202Method201ARandomVibrationMIL-STD-883,Method2026,Cond1(AthruK),Cond2(AthruJ)MIL-STD-202,Method214,Cond1(AthruJ),Cond2(AthruJ)FiberIntegrityGR-468-CORE(3.3.1.3.1and3.3.1.3.2)GR-326-CORE(3.3.1.3.3)FineLeak(He)SealMIL-STD-883,Method1014,A1,A2MIL-STD-750,Method1071HMIL-STD-202,Method112JESD22-A109GrossLeak(NID)SealMIL-STD-883,Method1014,C3MIL-STD-750,Method1071KMIL-STD-202,Method112JESD22-A109ConstantAccelerationMIL-STD-883,Method2001MIL-STD-202,Method212AMIL-STD-750;Method2006AEC-Q100,AEC-Q101ResistancetoSolventsJESD22-B107AEC-Q101,AEC-Q200MIL-STD-750,Method1022MIL-STD-883,Method2015MIL-STD-202,Method215K(A2LACert.No.2930.01)09/21/09Page3of3GateLeakageAECQ100-006ESD-HBMJESD22-A114MIL-STD-883,Method3015GR-468-CORETR-NWT-000870TIA/EIAFOTP-129AEC-Q100-002,AEC-Q200-002,AEC-Q101-001ESDSTM5.1-2001ESD-MMJESD22-A115AEC-Q100-003,AEC-Q101-002HighTemperatureOperatingLife(HTOL)JESD22-A108AEC-Q100ResistancetoSolderHeatMIL-STD883,Method2036,CondA,B,I,JandKMIL-STD-750,Method2031MIL-STD-202,Method210F,CondA,B,I,JandKAEC-Q101,AEC-Q200JESD22-B106VibrationFatigueMIL-STD-750,Method2046HighTempReverseBias(HTRB)AEC-Q101JESD22-A108MIL-STD-750,Method1042MIL-STD-883,Method1005HighTempGateBias(HTGB)AEC-Q101JESD22-A108MIL-STD-750,Method1042MIL-STD-883,Method1005CycledTHBJESD22-A100CMIL-STD-883,Method1004MIL-STD-750,Method1021EarlyLifeFailureRate(ELFR)AEC-Q100-008ExternalVisualJESD22-B101AMIL-STD-883,Method2009MIL-STD-750,Method2071IntermittentLifeMIL-STD-883,Method1006,1005MIL-STD-750,Method1036