您好,欢迎访问三七文档
当前位置:首页 > 行业资料 > 国内外标准规范 > 金属材料的X射线和γ射线照相检验通则
ISO5579:1998(E)XNONDESTRUCTIVETESTINGRADIOGRAPHICEXAMINATIONOFMETALLICMATERIALSBYX2ANDGAMMA2RAYSBASICRULES:TG115.28:C:100026656(2002)1020454206X,(IQI),:,1X,2,,,IEC()ISO()ISO1027:1983ISO2504:1973(IQI)ISO5580:1985ISO116991:3:3.1t:3.2w,()3.3b3.4d3.5(SFD)3.6f4,A:;B:ABB,B,f,A3.0,,A,B55.14542410200210NDTVol.24No.10Oct.2002©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.,XX,,5.22,17,1111.(d)2.ftb22,,(1):4(4),,,,5.333,(1):,2(2),4(4),5(5)44,,(1)55,(1):,,,,,,5.4,,554ISO5579:1998(E)X©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.66,(1):,()77,(1)5.5,,5.6,,,,5.7(IQI)ISO1027ISO250466.1X6.1.1X,X88500kVX6.1.21MeVX111MeVX()w/mmAB170Tmw5w5169Yb1)1w152w1275Se2)10w4014w40192Ir20w10020w9060Co40w20060w15014MeVX30w20050w180412MeVXw50w8012MeVXw80w100:1),A10mmw70mm,B25mmw55mm2),A35mmw120mm,192Ir60CoX,1X,,,,654ISO5579:1998(E)X©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.2wmm1)/mmABAB100kVXT3T2,0.03100150kVXT3T20.15150250kVXT3T20.020.15169Ybw5T3T2,0.03170Tmw5T3T20.020.15250500kVXw50T3T20.020.3250500kVXw50T3T30.10.32),0.020.375SeT3T20.10.22)192IrT3T20.020.20.10.22)192IrT3T20.020.260Cow100T3T30.250.73)60Cow100T3T30.250.73)14MeVXw100T3T20.250.73)14MeVXw100T3T20.250.73)412MeVXw100T2T214)412MeVX100w300T3T21,0.54)412MeVXw300T3T31,0.54)12MeVXw100T215),12MeVX100w300T3T215),12MeVXw300T3T315),0.5:1)2)0.1mm,0.03mm3)A0.52mm4),A0.51mm5)10%6.2,ISO116991,2331)ABmm150kVXT3T2,0.03,0.15150250kVXT3T20.020.15250500kVXT3T20.10.2169YbT3T20.020.1575SeT3T20.22),0.10.2:1)2)0.1mm0.1mm0.2mm,,23,6.3,,,,6.4,150400kVX,,754ISO5579:1998(E)X©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.,,,,,,14mm,,99192Ir60Co,,,0.52mm6MVX,,,150400kVX,,,,;,,B(10mm,1.5mm),,;,,6.5fmindb,fd,f/dAfd7.5b2/3(1)Bfd15b2/3(2)b1.2t,(1)(2)10bt10fmin10fmin(1)(2)A,,fminB,2,B(3),,(5,6),50%6.6B()1.1,A1.2,6.7,6.7()441)1)A2.02)B2.33):1)0.12),1153),2.0854ISO5579:1998(E)X©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.(6.9),,,,,0.3(),4,1.36.8,6.9ISO2504ISO55807,,,,,lvlwlxlylzl{l|l}l~AISO5576:1997X(431)5.33d,(4),,,,45.4,,200500mm,vi=litci(10)vii,km/slii,mmtcii,smvSvcvmv=1nni=1vi(11)Sv=ni=1v2i-nm2vn-1(12)cv=Svmv(13),()954ISO5579:1998(E)X©1995-2004TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.
本文标题:金属材料的X射线和γ射线照相检验通则
链接地址:https://www.777doc.com/doc-9086442 .html