纳米通Nanoton失效分析部门培训讲义

©2007NANOTONGmbHNANOTONTRAININGNANOTONStorageFailureAnalysis10thJun2007FAEngineeringDept.©2007NANOTONGmbHNANOTONTRAINING22/18/2014FAProcessFlow/Coverage©2007NANOTONGmbHNANOTONTRAINING32/18/2014SPGServerProductCustomer/OBA/ORTFAProcessFlowOBA/ORTFailureEFAMFAMSLFAActivities:-Confirmationofsymptoms-ComponentisolationincludingCard-Temp/Voltagetestingifrequired-ClosureforknownissuesActivities:SendFailureandtestlog/informationActivities:-HDDDisassembly-Observationalanalysisofidentifiedcomponents-Closurebasedonteardownresults.-Closureoftestoptimization.Activities:-Componentanalysis-Materialanalysis-Probablecauseverificationandclassification-Closureforknownissues.Activities:-SupplierFA-DEFA-CNDverificationFAClosure&IssuedefinedHead/MediaFACardFAFurtherFA(IfRequired)MechanicalCustomerReturnFailureFAEActivities:-Recordingthefailuresymptom-SendFailure.-Testlog/informationCustomerLineIntegration,QualityAudit&ReliabilityTestTimeline(workingDays)Unitreceived1-2days4-8days1stStage2ndStage3rdstageLevel0Level0Level1Level2Level1Level2Level3Level4Level3Level44thstage21–30days1daysServo/Testoptimization©2007NANOTONGmbHNANOTONTRAINING42/18/2014Overviewof1stLevelFAProcess:ElectricalAnalysis1stLevelFA(MachineAnalysis)EstimatedfailuremodebyHiTestLogAnalysisbyHiTestGetLogDumpByNiagaraTestToolGetLogDumpByHiTestHiTestdiagnostictestitems(1)NoRead/Writetestincludedbutdetailedloganalysis.(2)Testtimeisapproximately45-60secondspereachHDD.TextDocument©2007NANOTONGmbHNANOTONTRAINING52/18/2014Overviewof2ndLevelFAProcess:ElectricalAnalysis2ndLevelFA(ElectricalAnalysis)DataanalysisFileErrorrecreationandanalysisPORstatusDriveusageanalysisSMARTdataanalysisErrorloganalysisErrortypeidentificationErrorlocationidentificationBitFlipAmplitudescope(data,servo)ServostabilityanalysisQuasitestHeadanalysis(SER,noise,etc.)ChambertestBenchtestErrorrecreationDriveanalysisRootCauseidentifiedCloseMech.FA,ComponentFAYNReadyNotReadyFollowCardDriveTestanalysisP-List,TA,DelamSER&OverwriteMediaMagneticImage(MagScanorDing)©2007NANOTONGmbHNANOTONTRAINING62/18/2014•Hardware:•LecroyHDDScope&DifferentialProbe•Powersupply•PC&InterfaceCard1xperEngineer•ISITester-FixtureforHDD/HSA:Transverse,PopCorn,MRR,SMANNoise•ThermalChamber•Software:•Niagara(EngineeringdiagnosticsoftwaretooltoperformgeneralHDDoperations).Supportthefollowingfeature::•MASC-Mediamagneticimagingtool(NeedLecroyDDA)•MagScan-Magneticperformancenearerrorsites•MagDing-SimilartoMagScan•BitFlip–VisualBitErrorRateafteroverwrite.•ServoCTP-diagnostictestsoftwaresuitetomeasureServoStability,RRO/NRROandRTV•TLC:TickleCLanguage,cannedroutinewrittenbyDEtoaccesseachpartsofthedrivehardware-controller,motordriver,channeletc.•MathLab/ServoTools.•DriveLog:•MediaLogDump•GEMFlyHeightData•SustainedTemperatureLogs•LoadSpeed(Min/Max)Data•SMARTLog2ndLevelFA:FATools©2007NANOTONGmbHNANOTONTRAINING72/18/20142ndLevelFA:FAToolsHeadSERanalysisServostabilityanalysisBitFlipanalysisNiagaraSoftwaredefect141tracks41tracksMASC-mediadefects(onservo)defect141tracks41tracksMASC-mediadefects(onservo)©2007NANOTONGmbHNANOTONTRAINING82/18/20142ndLevelFA:FAToolsLeCroyDDA-5005ALeCroyDDA-5005AAmplitudewaveformanalysisHeadnoiseanalysis314.0101.6108.05114.5120.95127.4133.85140.3146.75153.2159.65166.1172.55179ReadBias(mA)02500050000PopcornCount-200-150-100-50050100150200Field(Oe)Popcorn.1PartID:J8X8H6DCHead:Hd5PopCornTest-500005000100001500020000-300-250-200-150-100-50050100150200250300Transverse.Setup1_TBias:153.2PartID:J8X8H6DCHead:Hd5Amplitude(uV)MagneticField(Oe)ForwardReverseTransverseCurve050010001500200025003000350040004500-200-150-100-50050100150200S.M.A.N.IITest.1PartID:J8X8H6DCHead:Hd5PatentPendingNoise(礦)Field(Oe)NoiseAmpNoiseRMSMaxNoiseAmpSMANNoiseQuasiTesterWithHSAFixtureQuasiTesterWithHSAFixture©2007NANOTONGmbHNANOTONTRAINING92/18/20142ndLevelFA:LogAnalysisHelpstounderstanddrivehistory,performance,errortypesanderrorlocationsLogicalandPhysicalErrorLocationsPOH,ErrorType(UEC)andTemperaturelistedforeacheventGEMFlyHeightDataLoadSpeed(Min/Max)DataSustainedTemperatureLogsMediaLogDump©2007NANOTONGmbHNANOTONTRAINING102/18/20142ndLevelFA:LogAnalysisHelpstounderstanddrivehistory,performance,errortypesanderrorlocationsSingle/MultiSectorOverwritecomparetoFunctionSVGAComparetoFunctionalP/GListDefectPlot–Soft&HardErrorSERComparetoFunctional©2007NANOTONGmbHNANOTONTRAINING112/18/2014ServoAnalysisTool-ModelLPPlantTransferFunction0180360Phase,degCBC2HDVT2LowPowerCBC089/091/092:FunctionTestPlantatODN=4551015202530-90-80-70-60-50-40-30Amplitude,dBFrequency,kHz01Frequency(KHz)1HGAT19.7K2BF110.6K3Armtorsion#113.5K4Armtorsion#213.8K5Arm/HGAbending16.3K6BF318.5K7Arm/HGAsway25K8Coilbreath26K9BF427.8KMode123456789©2007NANOTONGmbHNANOTONTRAINING122/18/2014ServoAnalysistool-NRRO,LowFrequencyPortion0123456700.10.20.30.40.50.60.70.80.91%TP,ODCBCFunctionTestNRROFFT,ODN=330123ASB12650HzouterHeadsASB12880HzinnerHeadsHGAB14000HzInnerHeadsASB24530HzinnerHeadsASB24350HzouterHeadsTBDNoknownactuatormodeshereDisk2550HzDisk2770HzDisk4860HzDisk3860HzDisk3410HzDisk3210HzDisk2670HzDis