EMC常用设备

IEFTIIESDIIISURGEIVDIPS,VARIATIONEFTESDSURGEACDIPSTheTRA2000withitsaccessoriescomplieswiththeIECStandards61000-4-2,-4,-5,-8,-9,-11,-12,-16,-29VariationTRA2000TRA-SystemformorethanadozenTransientImmunityTestsEasyOperation-TransientTesterForAllApplicationsSomeOutstandingFeaturesTheTRANSIENT-2000hasbeendesignedspecificallytomakeitaseasyaspossibletouse.Oneofthefeaturesisthelargecleardisplay.Throughouttheoperation,parameterscanbechangedimmediatelysimplybypress-ingbuttons+/-tofindanyweakpoints.Whatcanbevaried:couplingpathbypressingthecouplingpathswitchesonthefrontpanel,voltage,spikefrequency,burstduration,synchroangleandpolarity.Thepowersupplyvoltagecanalsobechangedduringoperationtosimulatepowersupplytolerances.AllrelevantparametersinonedisplayEasychangesduringoperationThreedifferentDIPSMenusWiththreedifferentmenuoptionstochoosefrom,mostdipsandinterruptiontestneedarecovered.IEC61000-4-11dipsandIEC61000-4-29dinterruptionond.c.TheGENECSSoftwareThedisplayonthecomputermonitorscreenisexactlythesameasontheTRAunititself.ThisenabletocontroltheTRAN-SIENT-2000fromthePC,preparetestsorprogrammesonaPC,thendownloadedtotheTRA.DialoguelinelanguagecanbechosenDifferentmagneticfieldantennascanbeselectedinthemenuasrequiredbytheIEC-8forcontinuousandshorttimetestsandpart9forSURGEtest.ThetestlevelscanbedirectlychoseninA/m.Easyusewith“Pulldownmenu”andahelplineformostparameter.Magneticfields-8,-9uptofullevelsThreedifferenttransientimmunitytest-ersareavailablefromEMCP:TRA2000:EFTandSURGEupto4kV,ESDupto15kV,DIPSVariation16A,260V.TRA2000IN4:asTRA2000plus10/700upto4kVandRingupto6kV.TRA2000IN6:asTRA2000plus10/700upto6kV,Ringupto6kVandSURGEupto6kV.Theoutstandingfeaturesare:•Spikefrequencyupto1MHz.•Testsetupcanbepreparedfordataandpowerlines.Programmableswitch-ingbetweendataandpowerline.•Burstdurationrampfortestingimmu-nityonanaloguecircuitwithincreasingenergyperburst.•RandomMode,thespikesarerandomlydistributed,fasterimmunitytestondigitalcircuits.•CompletetestsequencewithSURGE,ESD,EFT,DIPSpossible.ApplicationTwomethodscanbedistinguishedforthecouplingofburstinline:•couplingindatalines•couplinginpowerlinesEFTElectricalFastTransientIEC61000-4-4Sourceofinterference:Industrialmeasurementandcontrolequipmentpracticallyalwaysoperateinconjunctionwithconventionalcontrolunits(relays,contactors).Fluorescentlampballastunits,insufficientlysuppressedcoffeegrinders,vacuumcleaners,drillingmachines,hairdryers,universalmotors,etc.canbefoundeverywhereinthepowersupplysystem.Alltheseprimarilyinduc-tiveloadsproduceinterferencewhenswitchedonandoff.Awiderangeofswitchingtransients,alsocalledbursts,areproduced,withthefollowingwave-form.300VABCDEUsmaxUBmaxTsTsTstUUsfres.=(f1,f2)Tf4f4=1TfEFTtechnicaldataare:•Voltagerange0,22upto4,4kV•Sourceimpedance50Ohm•Fronttimeat50Ohm5ns•Pulsedurationat50Ohm50ns•Spikerep.frequencyupto1MHz•Loadindependentwith1000Ohmduration50to150ns•••••Directoutputforexternalcouplingnetwork,internalcouplingnetworkpowerline16A,L-NorPEmax.280V•••••Rampfunctions:V-peak,spikefreq.,burstduration,synchronisationonpowersupply•••••RandomspikedistributiontoshortenthetesttimeThecapacitivecouplingclamp(length1m)fordatalineshassufficientcouplingcapac-ityofapprox.100pfforthefrequenciescontainedintheburstandformsaparallellinesubjecttointerference.EFTThecouplingnetworkforpowerlinescon-tainsacouplingcapacitorCk(33nf)foreachlineandafilterfordecouplingfromthepowersysteme.g.CDN2000-06-25orCDN2000-06-32.ESDElectroStaticDischargeIEC61000-4-2Sourceofinterference:Whatcauseselectrostaticdischarges?Apersonbecomeselectro-staticallychargedbywalkingoveraninsulatingfloorsurface.Thecapacityofthebodycanbechargedtoseveralkilovolts(1000V).Thiscapacityisdischargedwhencontactismadewithanelectronicunitorsystem.Thedischargeisvisiblewithasparkinmanycasesandcanbefeltbythepersoncon-cerned,whogetsa“shock”.Thedis-chargesareharmlesstohumans,butnottosensitive,modernelectronicequipment.Theresultingcurrentcausesinterferenceintheunitsormakeentiresystems“crash”.Ithasbeenknowntotheelectricalindus-tryforover25yearsthatelectrostaticdis-chargesasencounteredeverydaycanhaveadisastrouseffectonelectronicequipment.ThecostofdamagecausedbyESDisdif-ficulttoassess,butamountstobillionsofdollarsworldwide.Theareasmostaffectedare:•manufacturingofintegratedcircuits(chips).•thechemicalindustrye.g.withexplo-sions,firesrelatedtoandfromsparksofelectrostaticdischarges.•malfunctioningofprocesscontrollersandelectronicequipment.Technicaldata:•Contactdischargeupto8kV•Airdischargeupto15kV•Impulsecapacitor150pf•Dischargeresistor330Ohm•Holdingtime5s•Currentrisetime0,7to1ns•Maximumcurrent30A•Singledischarges•Repetitivedischargesupto20HzChangeableelectrodeforairandcontactdischargeTheoutstandingfeaturesare:•Samecontrolasfortheotherimmu-nitytestsEFT,SURGE,DIPS,there-foreautomatedtestsprogrammablewithotherimmunitytests.•Automatedpolaritychange•Signalisationofrealdischarge,onlytheeffectivedischargesarecounted•RecordingoftheESDtests•Statisticalmeasurementsarepossiblebecauseoftheautomatedcontrolandprotocol•Automatedrampfunctionforvoltage