您好,欢迎访问三七文档
当前位置:首页 > 商业/管理/HR > 质量控制/管理 > 测量系统分析-测量系统分析
MSAJuranInstituteofShanghaiCopyRight1Measurement]/]JuranInstituteofShanghaiCopyRight2Gage——/——QS9000JuranInstituteofShanghaiCopyRight3MeasurementSystem]]——QS9000JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight///---/JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight——=JuranInstituteofShanghaiCopyRight——]]JuranInstituteofShanghaiCopyRight——]/]JuranInstituteofShanghaiCopyRight4Discrimination——ISO10012/1:1992JuranInstituteofShanghaiCopyRight1/10%2/10%12JuranInstituteofShanghaiCopyRightAccuracy=-JuranInstituteofShanghaiCopyRightPrecision]]JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight]]]]JuranInstituteofShanghaiCopyRight——JuranInstituteofShanghaiCopyRight——JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight1BiasJuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight2Repeatability——ISO5725-1JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight3Reproducibility——ISO5725-1JuranInstituteofShanghaiCopyRight/JuranInstituteofShanghaiCopyRightGageRepeatability&Reproducibility——JuranInstituteofShanghaiCopyRight4Stability21JuranInstituteofShanghaiCopyRight5Linearity6%LinearityJuranInstituteofShanghaiCopyRightGR&RJuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight1Bias]x0]x1x2……x10]]]/100%0xx−=10XxiΣ=JuranInstituteofShanghaiCopyRight]]]]]JuranInstituteofShanghaiCopyRight]/]/JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight2GR&R(1)ShortMethod(2)LongMethod(3)GraphicalAnalysisJuranInstituteofShanghaiCopyRightGR&RGR&RJuranInstituteofShanghaiCopyRightGR&R1.2.3.JuranInstituteofShanghaiCopyRight————1/2——JuranInstituteofShanghaiCopyRight1ABR142223413671457259817JuranInstituteofShanghaiCopyRight=/=1.4GRR=5.15/d2*=6.1d2*—120%GR&R=GR&R/=6.1/20100=30.5%RRJuranInstituteofShanghaiCopyRight22102JuranInstituteofShanghaiCopyRight]10]]A]BC]3JuranInstituteofShanghaiCopyRightaRepeatability]nr]m]xijki=1,…,rj=1,…,nk=1,…,mJuranInstituteofShanghaiCopyRight]e=/d2*d2*—15.15e99%}x,...,xmin{}x,...,xmax{Rijm1ijijm1ijij−=∑∑===r1in1jijRnr1RRJuranInstituteofShanghaiCopyRightbReproducibility]nr]m]xijki=1,…,rj=1,…,nk=1,…,mJuranInstituteofShanghaiCopyRight]i=1,…,r5.150/d2*99%∑∑===n1jm1kijkixnm1xR}x,...xmin{}x,...,xmax{RRr1r100−==JuranInstituteofShanghaiCopyRight02e22015.5nm)15.5()dR15.5(σ=σ−∗JuranInstituteofShanghaiCopyRight:m=e2+02(c)()GR&R=5.15m(99%)*200dR=σJuranInstituteofShanghaiCopyRight%GR&RJuranInstituteofShanghaiCopyRightGR&R/100%:5.15100%mσJuranInstituteofShanghaiCopyRightGR&R/TV100%100%tTVTV=5.15tMINITAB%SVtmσσ]10%]10%JuranInstituteofShanghaiCopyRight]30%:]30%JuranInstituteofShanghaiCopyRight10%30%JuranInstituteofShanghaiCopyRightGR&RGR&RJuranInstituteofShanghaiCopyRight]]]]JuranInstituteofShanghaiCopyRight]]JuranInstituteofShanghaiCopyRight(3):/(Average/RunChart)(RangeChart)(WhiskersChart)-(PlotofAveragesbySize)(NormalizedIndividualsChart)JuranInstituteofShanghaiCopyRight3Linearityy—x—xˆˆy10β+β=10ˆb,ˆaβ=β=JuranInstituteofShanghaiCopyRight-%linearitylinearityJuranInstituteofShanghaiCopyRightxj(j=1,2,…n),r=1mxiji=1,2,…m,j=1,2,…nJuranInstituteofShanghaiCopyRight]]MINITABstatQualityToolsCagelinearitystudyJuranInstituteofShanghaiCopyRightr2(r2=1yxr=0yxJuranInstituteofShanghaiCopyRight]]]]JuranInstituteofShanghaiCopyRight4Stability]/]/]](&R&S)](/)xxJuranInstituteofShanghaiCopyRight:(1)ShortMethod(2)LongMethod(3)GR&RJuranInstituteofShanghaiCopyRight1]n=20]r]m=2]————JuranInstituteofShanghaiCopyRight2GPC]n=8]m=20JuranInstituteofShanghaiCopyRight0.5a0]Pa=0.5a200.5=0.5m5.0a+m5.0a−mamamaJuranInstituteofShanghaiCopyRight]GPCJuranInstituteofShanghaiCopyRight]B=xTPa’=0.5–]1.08—08.1)005.0'Pa(x)995.0'Pa(xRTT=−==JuranInstituteofShanghaiCopyRight]tt0×=3.31tJuranInstituteofShanghaiCopyRight3R&R]30]32/3R&R3Measurementsystemperformance]——Measurementtoolmaintenance]——JuranInstituteofShanghaiCopyRightMeasurementdiscrimination]——/Measurementenvironment]——JuranInstituteofShanghaiCopyRight JuranInstituteofShanghaiCopyRight1MetrologyJuranInstituteofShanghaiCopyRight2(TraceabilitytoStandards)——————ISO10012JuranInstituteofShanghaiCopyRightJuranInstituteofShanghaiCopyRight///JuranInstituteofShanghaiCopyRight]]]JuranInstituteofShanghaiCopyRight3——]]]/JuranInstituteofShanghaiCopyRight]——]——JuranInstituteofShanghaiCopyRight]]]]JuranInstituteofShanghaiCopyRight]]]/]]]]JuranInstituteofShanghaiCopyRight/]]/]/JuranInstituteofShanghaiCopyRight——]]]]]]JuranInstituteofShanghaiCopyRightAuABuBuCkuCk=295%k=399.7%JuranInstituteofShanghaiCopyRightPredictionTimeuAJuranInstituteofShanghaiCopyRight1/3-1/10kuC/T1/3JuranInstituteofShanghaiCopyRight1MΩ0.1%(1KΩ)5~25ºC(0.005%+3)231ºCJuranInstituteofShanghaiCopyRightiRi/kiRi/k1999.316999.232999.417999.143999.598999.064999.269999.925999.5410999.62R999.408n=10JuranInstituteofShanghaiCopyRightAΩ=−−=∑=knRRRsnii261.01)()(12Ω=Ω==kknRsuA082.010261.0)(JuranInstituteofShanghaiCopyRightB)01.03%005.0(Ω×+=kRaΩ=Ω×+Ω×==kkkkauB046.073.101.03408.999%005.
本文标题:测量系统分析-测量系统分析
链接地址:https://www.777doc.com/doc-414324 .html