可靠性强化试验与加速寿命试验综述

:1001-2486(2002)04-0029-04X,,(,410073):,,:;;:TB114.3:AReliabilityEnhancementTestingandAcceleratedLifeTesting:AnIntroductoryReviewCHENXun,TAOJun2yong,ZHANGChun2hua(CollegeofMechatronicsEngineeringandAutomation,NationalUniv.ofDefenseTechnology,Changsha410073,China)Abstract:Reliabilityenhancementtesting(RET)andacceleratedlifetesting(ALT)arethefocusofattentioninreliabilitytestingresearchatpresent.ThebasicconceptsaboutRETandALTarediscussedatfirst.Thestate2of2the2artintheresearchconcernedisthenbrieflyreviewed.ThepossibledirectionsforfurtherresearchinRETandALTaresummarizedintheend.Keywords:reliabilitytesting;reliabilityenhancementtesting;acceleratedlifetesting,,,,(),,,,,,,,RETHALTHASS(StepStressTesting),,HALTHASS(ALT)(ESS),,,RETHALTHASS,1967[17],,,,,,,,X:2002-01-09:(41319030101):(1964-),,,244JOURNALOFNATIONALUNIVERSITYOFDEFENSETECHNOLOGYVol.24No.420021(RET),2050,70,,,,,1988Hobbs(HALT)(HASS),,,;,,(Physicsoffailure),,,,HALTHASS,[17],,QualMark1995519963,193347(),[5],,QualMarkOtisElevatorHobbsEngineering,BoreingHP,:GreggK.HobbsS.SmithsonJosephCapitanoWayneNelsonMikeSilver2manDavidRaheGreggK.Hobbs;S.SmithsonJosephCapitano;WayneNelson;MikeSilvermanDavidRahe,BoeingRobertW.Deppe:JohnHanse,,,,,,,1999EntelaFMVTmachine(FMVT:Fail2ureModeVerificationTesting),,,,EnvirotronicsAngelantoniCapeEngineerin,,,,,,,,2,:,2060,,MazzuchiHirose[18,19],WatkionsBugaighis[20,21],0320024McLinnWangKececioglu[22,23],,,,1961DodsonHoward,,,NelsonBhattacharyyaTangSun[24][25][26],,1958Kimmel,,,,,ChernoffMeekerNelsonKhamisHigginsYeoTang[2731],,,20,2070,,,,[32],[33][3437],[3841],,He-Ne,,19814[42]3,,,,,,:;;;;;;,,:;;;;(ALT2CAE):[1]HobbsGK.HALTandHASSSeminar[C].Detroit,MI,February26,1996.[2]RobertH,Gusciora.TheUseofHALTtoImproveComputerReliabilityforPoint-of-SaleEquipment[C].1998ProceedingAnnualReliabilityandMaintainabilitySymposium,89-93.[3]DavidRahe.TheHASSDevelopmentProcess[C].2000ProceedingAnnualReliabilityandMaintainabilitySymposium,389-394.[4]SilvermanM.HASSDevelopmentMethods:ScreenDevelopment,changeschedule,andre-proveschedule[C].2000ProceedingAn213:nualReliabilityandMaintainabilitySymposium,245-247.[5]SilvermanM.SummaryofHALTandHASSResultsatanAcceleratedReliabilityTestCenter[C].1998ProceedingAnnualReliabilityandMaintainabilitySymposium,30-36.[6]RobertWD.ReliabilityEnhancementTesting(RET)[C].1994Proc.AnnualReliabilityandMaintainabilitySym,91-98.[7]CharlesFelkins.Halt-hasstutorialonequipment,Fixtures,Processes&Implementation[R].StorageTechnologyCorp.LouisvilleCO,80028-4142.[8]MikeHicks.Papersonhalt,HASS&Acceleratedstresstesting[R][e-mail].[9]AndersonJA,PolkinghomeMN.ApplicationofHALTandHASSTechniquesinanAdvancedFactory[C].19975thInternationalConferenceonFACTORY2000,223-228.[10]KevinGranlund.AMethodofReliabilityImprovementUsingAcceleratedTestingMethodologies[R].EMCCorp.[11]ClittonJ,Seusy.AchievingPhenomenalReliabilityGrowth[R].Hewlett-PackardCompany.[12]NeilDoertenbach.HighlyAcceleratedLifeTesting---TestingWithaDifferentPurpose[C].IEST,2000proceedings.[13]HarryMclean.HighlyAcceleratedStressingofProductsWithVeryLowFailureRates[R].Hewlett-PackardCompany.[14].(HALT)(HASS)[J].,2001(3).[15].[J].,2000(01)[16].[C].,1998,3.[17]YurkowskyW,SchafterRE,FinkelsteinJM.AcceleratedTestingTechnology[R].TechnicalReportNO.RADC-TR-67-420,RomeAirDevelopmentCenter,1967.[18]MazzuchiTA,SoyerR.DynamicModelsforStstisticalInferencefromAcceleratedLifeTests[C].IEEEProceedingsofAnnualRelia2bilityandMaintainabilitySymposium,1990.[19]HiroseH.EstimationofThresholdStressinAcceleratedLife-Testing[J].IEEETransactionsonReliability,42(4),1993.12.[20]WatkinsAJ.Review:LikelihoodMethodforFittingWeibullLog-LinearModelstoAcceleratedLife-TestData[J].IEEETransac2tionsonReliability,43(3),1994.9.[21]BugaighisMM.ExchangeofCensorshipTypesanditsImpactontheEstimationofParameterofaWeibullRegressionModel[J].IEEETransactionsonReliability,44(3),1995.9.[22]McLinnJA.NewAnalysisMethodsofMultilevelAcceleratedLifeTests[C].IEEEAnn.ReliabilityandMaintainabilitySym,1999.[23]WangW,KececiogluDB.FittingtheWeibullLog-LinearModeltoAcceleratedLife-TestData[J].IEEETrans.onReliability,49(2),2000.6.[24]NelsonW.AcceleratedLifeTestingStep-stressModelsandDataAnalysis[J].IEEETrans.onReliability,(R29)2,1980.[25]BhattacharggaGK,SoejoetiZA.ATamperedFailureRateModelforStep-StressAcceleratedLifeTest[J].CommunicationsinStatistics-Theory&Method,(18)5,1989.[26]TangLC,SunYS.AnalysisofStep-StressAccelerated-Life-TestData:ANewApproach[J].IEEETransactionsonReliability,45(1),1996.[27]ChernoffH.OptimalAcceleratedLifeDesignsforEstimation[J].Technometrics,(4)3,1962.[28]MeekerWQ,NelsonW.OptimumAcceleratedLifeTestsfortheWeibullandExtremeValueDistributions[J].IEEETransactionsonReliability,(R-24)6,1975.[29]YanGuangbin.OptimumConstant-stressAcceleratedLifeTestPlans[J].IEEETransactionsonReliability,(R-43)4,1994.[30]KhamisIH,HigginsJJ.Optimum3-StepStep-StressTests[J].IEEETransactionsonReliability,45(2),1996.[31]YeoKP.PlanningStep-StressLife-TestwithaTargetAcceleration-Factor[J].IEEETrans.onReliability48(1),19