EIA-364-06C-Contact-Resistance-Test-Procedure-for-

EIASTANDARDTP-06CCONTACTRESISTANCETESTPROCEDUREFORELECTRICALCONNECTORSEIA/ECA-364-06C(RevisionofEIA-364-06B)MARCH2006ELECTRONICCOMPONENTS,ASSEMBLIES&MATERIALSASSOCIATIONTHEELECTRONICCOMPONENTSSECTOROFTHEELECTRONICINDUSTRIESALLIANCEANSI/EIA-364-06C-2006Approved:March21,2006EIA/ECA-364-06CNOTICEEIAEngineeringStandardsandPublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforhisparticularneed.ExistenceofsuchStandardsandPublicationsshallnotinanyrespectprecludeanymemberornonmemberofEIAfrommanufacturingorsellingproductsnotconformingtosuchStandardsandPublications,norshalltheexistenceofsuchStandardsandPublicationsprecludetheirvoluntaryusebythoseotherthanEIAmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.StandardsandPublicationsareadoptedbyEIAinaccordancewiththeAmericanNationalStandardsInstitute(ANSI)patentpolicy.Bysuchaction,EIAdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheStandardorPublication.ThisEIAStandardisconsideredtohaveInternationalStandardizationimplication,buttheInternationalElectrotechnicalCommissionactivityhasnotprogressedtothepointwhereavalidcomparisonbetweentheEIAStandardandtheIECdocumentcanbemade.ThisStandarddoesnotpurporttoaddressallsafetyproblemsassociatedwithitsuseorallapplicableregulatoryrequirements.ItistheresponsibilityoftheuserofthisStandardtoestablishappropriatesafetyandhealthpracticesandtodeterminetheapplicabilityofregulatorylimitationsbeforeitsuse.(FromStandardsProposalNo.5106formulatedunderthecognizanceoftheCE-2.0NationalConnectorsStandardsCommittee.Publishedby©ELECTRONICINDUSTRIESALLIANCE2006TechnologyStrategy&StandardsDepartment2500WilsonBoulevardArlington,VA22201PRICE:PleaserefertothecurrentCatalogofEIAElectronicIndustriesAllianceStandardsandEngineeringPublicationsorcallGlobalEngineeringDocuments,USAandCanada(1-800-854-7179)International(303-397-7956)AllrightsreservedPrintedinU.S.A.iPLEASE!DON'TVIOLATETHELAW!ThisdocumentiscopyrightedbytheEIAandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:GlobalEngineeringDocuments15InvernessWayEastEnglewood,CO80112-5704orcallUSAandCanada(1-800-854-7179),International(303-397-7956)iiCONTENTSClausePage1Introduction...............................................................................................................11.1Scope.........................................................................................................................12Testresources...........................................................................................................12.1Equipment.................................................................................................................13Testspecimen............................................................................................................23.1Description................................................................................................................23.2Preparation................................................................................................................24Testprocedure...........................................................................................................25Detailstobespecified...............................................................................................36Testdocumentation...................................................................................................4Figure1Testcircuit................................................................................................................4iii(Thispageleftblank)EIA-364-06CPage1TESTPROCEDURENo.06CCONTACTRESISTANCETESTPROCEDUREFORELECTRICALCONNECTORS(FromEIAStandardsProposalNo.5106,formulatedunderthecognizanceEIACE-2.0CommitteeonNationalConnectorStandards,andpreviouslypublishedinEIA-364-06B.)1Introduction1.1ScopeThisstandardestablishestestmethodstodeterminetheresistanceofmatedconnectorcontactsattachedtolengthsofwirebymeasuringthevoltagedropacrossthecontactswhiletheyarecarryingaspecifiedcurrent.2Testresources2.1Equipment2.1.1Anammetercapableofmeasuringtheappliedcurrenttoanaccuracyof±2%.2.1.2Ahigh-impedancevoltmeter(intheorderof10,000ohmspervolt).Themeteraccuracyshallbesuchthatthevaluebeingmeasuredisaccurateto±2%.NOTE⎯Forgreatereaseofmeasuringforwardandreversereadings,azero-centerordigitalvoltmeterwithautomaticpolarityreversalisrecommended.2.1.3Asuitablecurrentsourcehavingacontrolledoutputasrequiredfortestcurrentsspecifiedinthereferencingdocument.Eitheracordcmaybeusedforthiscontactresistancetest.Foracmeasurements,thefrequencyshallnotexceed2kHz.Intheeventofadiscrepancybetweenacanddcmeasurements,thedcmethodshallbeemployed.2.1.4Anexampleofatestcircuitisshowninfigure1forthetestm