TR8000_Analog_Digital_Test_Theory_v2-0-0

TR8000SeriesSmartIn-CircuitTestSystemUserGuide–Analog/DigitalTestTheoryver.2.0.0JAN.27,2011TestResearchInc.TR8000UserGuide–Analog/DigitalTestTheoryv.2.0.0TR8000Series–SmartIn-CircuitTestSystemUserGuide–Analog/DigitalTestTheoryv.2.0.0Copyright©2008TestResearchInc.Allrightsreserved.ThisdocumentmaybeprintedorphotocopiedonlybycustomersorauthorizedagentsofTestResearchInc.(TRI)forsoleusebytheiremployeesworkingwithTRItestsystems.AnyotheruseofthisdocumentmustbeapprovedbyTRI.Specificationsandsoftwarearesubjecttochangewithoutnotice.TRIwillmakeallbesteffortstoletexistingcustomersknowofanyproductupgrade,changeorphaseout.Alltradenamesandtrademarksarethepropertyoftheirowners.Foranycomments/correctionstothisguide,pleaseaddressthemto–[e-mail]“TR8000USERGUIDE”intheSubjectfield.–Analog/DigitalTestTheoryv.2.0.0iContents1INTRODUCTION_______________________________________________12TESTTHEORYOFANALOGCOMPONENTS___________________________22.1Open/ShortTestTheory.................................................................................22.2WhyShortGroupsAreUsed..........................................................................32.3HowtoFormaShortGroup...........................................................................42.3.1DetermineValueofRawTHD........................................................52.3.2ShortTestTheory..........................................................................62.3.3SetupDelayTimeforShortTest....................................................72.3.4OPIandSPITest...........................................................................92.4JumperTestTheory.....................................................................................102.4.1Mode0(AdjustbyOPSRangeMeasure).....................................102.4.2Mode1(AdjustbyResisterMeasure)...........................................102.4.3Mode2(AdjustbyResistorMeasure)...........................................102.4.4Mode3(AdjustbyResistorMeasure)...........................................102.5MeasurementofResistor.............................................................................112.5.1ResistanceTestTheory................................................................112.5.2ConstantCurrentMode0.............................................................132.5.3LowConstantCurrentMode1......................................................142.5.4High-SpeedTestMode2..............................................................152.5.5GuardingTheoryforMode0andMode1.....................................162.5.6GuardingTheoryforMode2.........................................................182.5.7ACPhaseTest(Mode3,Mode4,Mode5)...................................202.5.84-WiresResistorMeasurement....................................................212.6MeasurementofCapacitor...........................................................................242.6.1UsingDCSourceTestMethod.....................................................242.6.2UsingACSourceTestMethod.....................................................252.6.3ACPhaseTestMethod.................................................................262.6.4ACMeasure(Modes0,1,2,3).....................................................282.6.5CX//RX(Modes5,6,7)...............................................................292.6.6DCConstantCurrentTestModes4,8,13,19.............................302.6.7AC1KPhase,WideRangeMode12...........................................312.6.8AC100KPhase,WideRange,Mode14.......................................312.6.9AC1M4-Wire,Mode15...............................................................322.6.10Mode11,AC1KSMD..................................................................322.7MeasurementofInductor.............................................................................332.7.1InductorTestTheory....................................................................332.7.2Measure(Modes0,1,2,3,9).......................................................352.7.3Lx//Rx(Modes5,6,7)................................................................352.8MeasurementofTransistor...........................................................................382.8.1MeasurementofVCE(Modes3,4)...............................................392.8.2MeasurementofHfe.....................................................................412.9MeasurementofFET....................................................................................462.9.1TestMode....................................................................................46TestResearchInc.iiTR8000UserGuide–Analog/DigitalTestTheoryv.2.0.02.9.2Mode14.......................................................................................472.9.3Mode15.......................................................................................482.9.4Mode18.......................................................................................492.9.5Mode19..............