高速信号眼图测试中夹具影响的校准

,,,,(,100083):,,,,.Q,.:;;;:TN707:A:037222112(2004)0921563203CorrectionoftheFixtureEffectontheHighSpeedEyeDiagramMeasurementSUNJian2wei,ZHANGSheng2li,WANGYou2lin,XIELiang,ZHUNing2hua(InstituteofSemiconductors,ChineseAcademyofSciences,Beijing100083,China)Abstract:TocorrectthefixtureeffectonthedeviceusedinhighspeedeyediagrammeasurementathighbitratesaboveGb/s,acorrectionmethodbasedontimedomainmeasurement,frequencydomainmeasurementandfastFouriertransformshasbeenpro2posed.Undertheguidanceoftheproposedmethod,experimentsweredesignedandperformed.Itisfoundthatthecorrectedeyedia2gramfitsthedirectlymeasuredeyediagramverywellandthecorrectedparameters,suchaseyeheight,Qfactor,risetime,falltimeandpeak2to2peakjitter,areverydifferentfromtheuncorrectedparameters.Keywords:eyediagram;fixture;fastFourierfransforms;transferfunction1,,10Gb/s40Gb/s[1],...,,:..,:Q.,,;(),,..,;(1Gb/s),.,..,[2].,.,.Kompa[3].,,.,,.,,;,,,.,,(FFT)(IFFT),.21(a).ZS,YL.50,ZS=1/YL=50.,1(a).1(b),.,.1(a),:2003203203;:2003209222:973(No.G2000036601);(No.69825109)920049ACTAELECTRONICASINICAVol.32No.9Sep.20041faout(t),:faout()=Ha()fin()(1)fin();Ha().Ha()fin(),faout(),.fin(),1(d),,fdout(t),FFTfdout(),:fin()=[fdout()/Hd()](2)Hd().ABCD[4],AdBdCdDd=MsML=1Zs0110YL1(3)MsMLABCD.:Hd()=1/Ad=1/(1+ZsYL)(4),ZsYL,Hd().,1(a)ABCD:AaBaCaDa=MsMDML=1Zs01abcd10YL1(5),MDABCD,.1(a):Ha()=1Aa=1a+zsc+(b+zsd)YL=1X+Y(6),X=a+bYL,Y=cZs+dZsYL.,ABCDS,Ha(),1(b).1(b)ABCD:AbBbCbDb=MsMFMDML=1Zs01aFbFcFdFabcd10YL1(7)MFABCD.ZS=1/YL,:Hb()=1Ab=1X(aF+ZscF)+Y(bFYL+dFZsYL)(8),ABCDS.1(b)Hb()[6],.,(8)XY.XY,XY.(),1(c).XY,Ha().3,22.,51.315mmSMA,S,31(b)1(c),.(ADVANTEST)D3186(Zs=50)(Tek2tronix)CSA800045(YL=1/50-1).SHP8720D.3Hb().80ps.4.4(a),4(b).(1(b));465120046(1(a));(1(a)).,.,215Gb/s800mV271.5,,(2),,7DFB250.6(a);6(b)..1.6(c),.,GPODFB.,,.7.2..132516mV44212mVQ91172013911218ps3712ps12610ps3610ps1618ps1516ps22310mV2513mVQ8129109310ps3412ps10610ps4316ps3418ps1018ps4,,,FFT;FFT;S;;IFFT,...,,.:[1]LudwigR,etal.Enablingtransmissionat160Gbit/s[A].OFC2002[C].California:OFC,2002.[2]SilvonenK.NewAlgorithmsforNetworkAnalyzer,TestFixtureandWaferProberCalibration[M].Finland:FinnishAcademyofTechnolo2gy,1999.[3]KompaG,RaayFV.Error2correctedlarge2signalwaveformmeasure2mentsystemcombingnetworkanalyzerandsamplingoscilloscopecapa2bilities[J].IEEEMTT,1990,38:358-365.[4]ReinholdLudwig,etal.RFCircuitDesignTheoryandApplications[M].USA:PearsonEducation,Inc.,2002.[5]PaulD,etal.Measuringthefrequencyresponseofgigabitchipphotodi2odes[J].JournalofLightwaveTechnology,2001,19(9):1333-1339.:,1971,19951998.,.56519: