可编程逻辑器件在家电测试仪中的应用

20320015JournalofWuxiUniversityofLightIndustryVol.20,No.3May.,2001:1009-038X(2001)03-0302-05:2000-10-10;:2001-03-15.:([2000]65).:(1977-),,,.,,(,214036):(PLD),PLD.,.:;;:TP2:ATheApplicationofPLDinHouseholdElectronicAppliancesTesterJINXiao2jun,JIZhi2cheng,SUNXing2hai(SchoolofInformationandControlEngineering,WuxiUniversityofLightIndustry,Wuxi214036,China)Abstract:Onthebaseofanalyzingthecharacteristicsanddesigningmethodsofprogrammablelogiccomponent,anewkindofdesigningmethodoftesterofhouseholdelectronicapplianceswithPLDisintroducedinthispaper,whichismoreeconomicalandstablethantraditionalmethods.Keywords:PLD;householdelectronicappliancestester;systemprogrammable,PLD(ProgrammableLogicDevice),2080,.,PLD:(1),PLD;(2),.,.Lattice1992(ISP),,PLD,,,,.1,(PLD).1,K0,K1,K2,LEM,L(M)G,.1Fig.1Testmeterstructure2PLD2.1ISPPLD,,,,,(ABELVHDL),PLD,,JEDEC().,,,JEDECPLD,,.2.2.2,.,/,,XD1,KM1,,XD2.,XD4,KM3,82k,1500V,,XD5.,,XD1,KM2,,500V,1,6.6,(),XD3,,.KM2,.,XD4,KM4,,1500V(),(),XD6,.3,6,6,KM4,.,,.2Fig.2Simplifieddesign2step2.3PLD,PLD,.3033:PLDLattice1032E270LJ84,192,64I/O,.,PLD:/,,,,,.:XD2XD1XD3,XD5XD4XD6,JYWARNGY2WARN,KM1KM2,KM3KM4.2.4PLDLatticePLDispEx2pert7.0,,,,ABEL,.PLD3.3Fig.3Systemprincipleschema3NEW111,ABEL,(),,,.,,NEW111A02A3,A02A3108,.LATCH,.PULSE,,500V1500V,,.,500V40320TIMER1,.,,1500VTIMER3,.,,,.JCENGYJCJYJCGYZTJYZTQDEN/.33.1500V.44Fig.4Regulatorcircuitofhighvoltage,,,,,,VCR.:,.,,,VCR,,.3.2,1000V1min,10mA,1S.,LEM,,,,,,LEM,,.LEM,,BLB0.05,00.07A,1%,2000V/min,11,0100KHz.5.5Fig.5Highvoltageleakagecurrentcircuit4PLD,,,PLD.10M,9M,;8m,7m,.6.5033:6Fig.6Simulatedcurves5PLDPLC,,,ISP,.:[1].[M].:,1999.[2].EDA[M].:,1999.[3],,.[J].,1997(3):3739.(:)60320