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Vol.51No1ENGINEERING&TESTMar.2011[]2011-03-07[](1956-),,,,()林俊明(爱德森(厦门)电子有限公司,福建厦门361004):(),,():;;;;:TG11528:Bdoi:103969/j.issn.1674-3407.2011.01.001DevelopmentandNewProgressonElectromagneticTestTechnologyLinJunming(Eddysun(Xiamen)ElectronicCo.,Ltd.Xiamen361004,Fujian,China)Abstract:Electromagnetictesttechnologyiswidelyusedforsurfaceinspectionofconductivemate-rialsinaviation,spaceflightindustry,nuclearpowerindustry,metallurgy,petroleum,motorandrailwaybecauseofitshighsensitivity,speedandefficiency.Thepapersummarizesthedevelop-mentandthenewprogressofelectromagnetictest,suchaseddycurrenttest,magneticfluxleak-agetestandmetalmagneticmemorytestinrecentyears.Keywords:Electromagnetictest;eddycurrenttest;magneticfluxleakagetest;metalmagneticmemorytest;nondestructivetestintegratedtechnology1,,,4,53-4,,,18,,(),,22.1,,,[1]2.1.1阵列涡流检测技术的研究,,,1(Arrayeddycurrenttesting,AECT),(),(Arrayeddycurrentprobe,AECP),,,,(Eddycurrentprobe,ECP)(),,,,,AECP,,:(1)(2)(),(3)(),,,,()(4),,(5)C,,,,,2.1.2脉冲涡流检测技术的研究,,(Pulsededdycurrent,PEC),(),PEC,()()(),,,,(1),,,=2(1):-;-;-;-:,,,;,,,,,2.2,,,,AECTPECT,2.2.1阵列涡流检测设备,()SMART-5097/Olym-pus-NDTOmniScanMXECASMART-5097/(1),28,8(2),1SMART-5097/2March20112OmniScanMXECA,,(),2.2.2脉冲涡流检测设备PECTGEPulsec,,(GiantMagnetoresistance,GRM),,4()X,,,()EEC-83,,2.32.3.1阵列涡流检测技术的应用AECP,:(1),,,AECT,,AECT,()(2)100%,AECT,,(3)AECT,,,,AECT,(4),,13mm/s50/,,AECT500mm/s,10~20,(5),;AECTAECP,,,,,,,,AECP,,AECT,AECP2.3.2脉冲涡流检测技术的应用,:(1)GEPulsec,4(2)3No.12011:200mm,30mm,()(3)C-,3,,,,,,,[2],,,,,FOERSTERAMFTUBOSCOPEFOERSTERRO-TOMATTRANSOMATROTOMAT,20mm-520mm()5%TRANSOMAT,26mm-440mm()5%ROTOMATTRANSOMAT,SAM,,SAM0.3mm,10SAM,50mm-100mm,30t/h-70t/h,SONOSCOPE5%12.5%,(),,300km,10%,[3],:(),,,3mm2,1.6m/s,,JFY-1A,,4(MetalMagneticMemoryTesting),:,,Hp,,4March2011,,,,21NDT[4]4.1()EMS[5]EMS-2000(),,,TSC-1M-4,,A/DDSPPCSMT,,4.2,,,,,,5,,,,FPGAARMDSP,NDT,,,(),[6],,A/D,,NDT,NDT,()EEC-2008NET/GEApollo/EEC-2008NET/(3)3EEC-2008NET/Apollo/(4)4Apollo/(29)5No.12011:u=u2(u4.3.1)+u2(u4.3.2)+u2(u4.3.3)+u2(u4.3.4)+u2(u4.3.5)+u2(u4.3.6):=u4u4ii:2.12V,:=23:1.90V,:=21:1.80V,:=215,uc:uc=u2+u2+u2ucCu=4.4V,ucAl=3.8V,ucZn=3.4V6eff=u4cu4ii,:effCu=97,effAl=92,effZn=90t(P=0.95),=2:k0.95(97)=1.986,:k0.95(92)=1.988,:k0.95(90)=1.9897:S(419.527)(660.323)(1084.62)9.64V/,10.40V/,11.80V/:U=uc,-10:UCu=1.9864.416=8.89V(0.74)UAl=1.9883.776=7.68V(0.72)UZn=1.9893.416=6.87V(0.70)8,,,,,,,,,[1][M]..[2]JJG75-199510-[S].[3][M]..[4][M]..(5)6,,,,,,,NDT,,,,,[1],,.[M].:,2000.[2],,,.[J].,2007.[3].[J].,2006.[4],,,.[J].,2009.[5],,.[J].,2010.[6].NDT[J].,2008,(4).29No.12011:10-
本文标题:电磁无损检测技术的发展与新成果
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