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158Vol.15,No.820038HIGHPOWERLASERANDPARTICLEBEAMSAug.,2003:100124322(2003)0820788205X,,,,,,(,100084):SEEG,,,SEEG:;;;:TL54:A()[6][14],[57],SEEG,[6]SEEG,SSEEG,S1,:Vrf=148kV,f=21998GHz,d=1.5cm,,,1000,dt=T/1000dt,Fig.1Traceoftheelectronsemittingatdifferentphase1X:2003201224;:2003204213:863:(19672),,,;E2mail:tang.xuh@mail.tsinghua.edu.cn©1995-2005TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.z2=z1+v1dt(1)p2=p1+Vrfsin(t+)edt/d(2)v2=p2/(m20+p22/c2)1/2(3):z2,p2,v2t+dt;z1,p1,v1t;m0;e;c;0,0180,1,10,,1(a)060:,1(b),1(c)1(d)6569,748392103,,2,,SEEG,,,2.1:d=1.5cm,Vrf=148kV,f=2.998GHz,mul=10,TT=0.9677,0,2.1ps2,,10,Fig.2Plotforcurrentdensityvstime2Fig.3Saturatedcurrentdensityvsfrequency32.2:1cm,9.7,Vrf,mul=20,TT=0.9677,eVrf/2,211psSEEG,33,[2]2.3V0,,,V0=eVrf/m0(d)2(4)d12cm,2GHz,0.200.34V0,V0(4),VrfVrfSEEG,,V0,,4,:mul=10,TT=0.9677,0,9878:©1995-2005TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.Fig.4RelationshipsbetweennormalizedvoltageV0andsaturatedcurrentdensity4V05psV00.33,[3]0.37,V0V0=eVrf/m(d)2=1/(cos+2sin)(5),33.1SEEG,,,5;1Fig.5Geometricshapeofthecavity51Table1GeometricsizeofthecavityofmicropulseelectrongunD/mmh/mmR1/mmR2/mmZ/mml/mm56.08411.51.568,,,,0.3mm,SUPERFISH5mm,2,32,;3,Z,f,T,ZT2,Q23,,,Z,Z,,,2Table2EffectofthecathodepositionchangeZ/mmf/MHzTZT2/(Mm-1)Q6.93012.685090.704972855.3297091.256.63009.205080.699328756.8617085.596.33004.436700.691603558.1767078.0362997.662600.681631159.2177067.715.72987.714020.669476359.9237048.665.42974.711370.655626360.3777023.155.12958.716930.640475560.6436991.113Table3EffectofthegridpositionchangeZ/mmf/MHzTZT2/(Mm-1)Q6.93034.938410.592053339.5897123.076.63025.188610.621222045.3397107.956.33013.063560.651147551.8647089.7362997.662600.681631159.2177067.715.72977.654900.712481267.3157027.275.42952.928520.743091176.1666976.385.12923.182440.773019685.7206914.5309715©1995-2005TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.3.2MAFIA,SEEG:MgO,0.8,2998.484MHz,21.5kV6,629.2A/cm2,,96.76kW,180,50ps,15%x1.00610-3mrad,y919810-4mrad170,Fig.6DynamicssimulationresultsofaMPG6Fig.7Schemeofthemicropulsegun73.3SEEG,72.998GHz,TM0104[6]SEEG,,SEEG,,,:[1]LenLK,MakoFM.Self2bunchingelectronguns[A].Proceedingsofthe1999particleacceleratorconference[C].NewYork:BrookhavenNa2tionalLaboratory,1999,1:7074.[2]MakoFM,PeterW.Ahigh2currentmicro2pulseelectrongun[A].Proceedingsofparticleacceleratorconference[C].WashingtonDC:theAmeri2canPhysicalSociety,1993,4:27022704.1978:©1995-2005TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.[3]MakoFM,PeterW.ElectronGun[R].US:EP0809271A2,1997.[4]GuharaySK,LenLK,MakoF.High2currentmicro2pulseelectrongunsandacceleratorapplications[A].Proceedingsofthe2001particleaccelera2torconference[C].Chicago,2001.[5],,,.[J].,2001,13(5):615618.(HeWC,PeiYJ,JinK,etal.Simulationandanalysisofsecondaryemissionmicrowaveelectrongun.HighPowerLaserandParticleBeams,2001,13(5):615618)[6],,,.[J].,2003,27(6):546550.(TangCX,JiangZF,TianK,etal.Simulationofmicro2pulseelectronguns.HighEnergyPhysicsandNuclearPhysics,2003,27(6):546550)[7]YangXF,XuZ,JinX,etal.Theresearchofmicro2pulsegun[A].Proceedingsofthethirdinternationalsymposiumonpulsedpowerandplasmaapplications[C].Mianyang,SichuanProvince,2002.433466.Beamdynamicsresearchesonmicro2pulseelectrongunTANGChuan2xiang,TIANKai,CHENHuai2bi,LIQuan2feng,JIANGZhan2feng,WANGYing,XUYi2yong(EngineeringPhysicsDepartment,TsinghuaUniversity,Beijing100084,China)Abstract:Inthispaper,thebeamdynamicsinmicro2pulseelectrongun(MPG)isstudiedusingSEEG(SecondaryElectronE2missionGun)program.First,withouttheconsiderationofthespacechargeeffect,theprocessoflongitudinaldirectionbeambunchinginMPGisgiven.Second,theformationofthesaturationcurrentaffectedbythespacechargeeffectandbunchingeffectisstudiedinde2tails.Then,thedesignandoptimizationofthemicro2pulseguncavityandthesimulationresultsofthecavitybySEEGaregiven.Atlast,theschemeofaexperimentalmicro2pulsegundesignedbyTsinghuaUniversityisintroduced.Keywords:Micro2pulseelectrongun;Secondaryelectronemission;Spacechargeeffect;Bunchingeffect;Dynamicssimu2lation29715©1995-2005TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.
本文标题:微脉冲电子枪的动力学研究Ξ
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