测定纳米晶粒尺寸分布的新方法及其应用

(,510275)(1998525;1998827)X,,SnO2,,.PACC:6110;61461,,,,,.,,[1],,.,,(TEM)X()X(SAXS)XFourier[13],,,.,TEMX.X,X,X,X,.,SnO2,.2,X,,,.100nm,,,.,,,48219992100023290/1999/48(02)/0267206ACTAPHYSICASINICAVol.48,No.2,February,1999n1999Chin.Phys.Soc...211,;,D,.,I()=I0+D2ADwD2e-2(-0)2w2D,(1)I(),I0,ADD,D.,D,D,0.wDD,BB2=w2ln4,BDD=kBcos0,(2)X,k=0194.212w0,wDwD=a0D+b0,a0=kln4cos0,b0=w0ln4,(3)a0,b0.,D,(3)wD,(1),AD.AD(1030,),,,,.AD,ŠD=ADDAD.(4)X.3311X2SnO2,5008004h57h,862484,T5H04,T5H57,T8H04T8H57.SnO2.D/max23A(Cu,).0102,DS=1,RS=1,SnO2(110).3121T8H04,,..24,(4)1.1T8H04X()()1ŠD/nmT5H0441694157T5H5751105104T8H0491589143T8H5712173121331,ŠD,.ŠD,,.2(a)2,4,500,ŠD,,.P1,P2P4,P5,T5H579622:P3,(3nm).P3(2nm),P1,P2()(),,.2(b)800,.800,,,,,SnO2800.2(b)P6,P7P8,P9,P6P8,P7P9.,,,.4411(1),,.(2)(),X.1nm,,1nm,I0.2(a):500,.(9)ŠDI0,T5H57ŠDŠDT5H04,.(3),,[3,4],,.(4),D,.D,,,.(5),,,.(6):,1.,,.412:07248(1)X,.(2)X,.,,,PC(Origin,SigmaPlot,Axum),.(3),,.(4)(),.,.(5)X,,.(6).(7),350nm.ŠD4nm,I0;ŠD50nm,,,.5XX.SnO2,,,,.450nm.[1]ZhangLi2deandMouJi2mei,NanocrystallineMaterialScience(Sci.andTech.Press,Liaoning,1994),chp.6(inChi2nese).[2]LiShu2shang,BasicCrystalX2rayDiffractometry(MetallurgicalIndustryPress,Beijing,1990),p.175(inChinese).[3]HuRui2shengetal.JournalofChineseUseoftheRigakuX2rayDiffractometer,2(1988),127(inChinese).[4]T.R.MalowandC.C.Koch,ActaMater.,45(1997),2177.1722:ANEWMETHODTODETERMINETHESIZEDISTRIBUTIONOFNANOCRYSTALLINEGRAINSANDITSAPPLICATIONGUTANG2SHENGSHISHUN2SENLINGUANG2MING(DepartmentofPhysics,ZhongshanUniversity,Guangzhou510275)(Received25May1998;revisedmanuscriptreceived27August1998)ABSTRACTAnewmethod,Profile2fittingofX2raydiffractionspectroscopy(PFXDS)method,whichwasadoptedtodeterminethesizedistributionofnanocrystallinegrains,wasintroducedinthispaper.Itstheoreticalmodelandbasichypothesiswereclearlyinterpretedanditsadvantagesanddisadvantageswerediscussedindetails.ThePFXDSmethodwasappliedtothesizedistributioncalculationofnano2SnO2powderproducedbysol2geltechnologyandtherelativelyidealresultswereobtained.PACC:6110;614627248